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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 6502-6504 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have employed transmission electron microscopy and x-ray diffraction to investigate the properties of yttria-stabilized zirconium oxide (YSZ) sputter deposited on silicon. It is shown that the as-deposited YSZ films are polycrystalline (grain size 7–20 nm) with microvoids between grains. Anneals of these films at temperatures of 800, 950, and 1100 °C for 1 h eliminate the microvoids and cause the grain size to increase from 20 to 50 nm at the higher anneal temperatures. Particular texture of the YSZ film is controlled by the details of the deposition conditions. Resistivity measurements of superconducting films deposited on silicon using these buffer layers are also presented.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5510-5512 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Permanent magnets based on the compositions Pr15Fe79B6, Nd15Fe79B6, Pr15Fe62.5Co16Al1B5.5, and Nd15Fe62.5Co16Al1B5.5 have been fabricated employing conventional powder metallurgical processes. Proper heat treatment has been found to improve magnetic properties. For example, in magnets of composition Pr-Fe-Co-Al-B, the heat treatment optimized in this study improved Br and (BH)max by about 5% and 10%, respectively, in comparison with conventional heat treatment reported in the literature. The temperature coefficients of magnetic properties have also been improved through Co and Al substitutions.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6677-6679 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A double layer Cr film structure has been prepared by sputter depositing Cr on single crystal Si substrates first without substrate bias and then with various substrate bias voltages. Without substrate bias, Cr{200} texture grows on Si at room temperature; thus the first Cr layer acts like a seed Cr layer with the {200} texture, and the second Cr layer, prepared with substrate bias, tends to replicate the {200} texture epitaxially. CoCrTa and CoNiCr films prepared on these double Cr underlayers, therefore, tend to have a {112¯0} texture with their c-axes oriented in the plane of the film. At the same time, the bias sputtering of the second Cr layer increases the coercivity of the subsequently deposited magnetic films significantly. Comparison studies of δM curves show that the use of the double Cr underlayers reduces the intergranular exchange interactions. The films prepared on the Si substrates have been compared with the films prepared on canasite and glass substrates. It has also been found that the magnetic properties are similar for films on canasite and on glass.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 229-231 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The planar defects which are commonly observed in deposited Co-Cr and Co-Ni-Cr magnetic thin films have been characterized by electron microdiffraction and trace analysis. It was unambiguously shown that these planar defects are (0001) stacking faults, which are thought to be formed to reduce the growth stress of the film during deposition.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Polarization dependent extended x-ray absorption fine structure (PD-EXAFS) and magnetic circular dichroism (MCD) measurements of CoCrTa and CoCrPt films, sputter deposited at varying substrate temperatures, were performed to investigate the average local structure and chemistry about the Ta, Pt, and Co atoms and the average magnetic moment of the Co and Cr atoms within these films. Results from the MCD measurements indicate the average net magnetic moment of the Cr atoms is opposite in direction and five percent in amplitude relative to the Co moments. Inspection of the Fourier transforms of the XAFS data from these samples shows an increase in structural disorder around the Ta and Pt atoms with increasing substrate deposition temperature. A further comparison between the Ta and Pt edge EXAFS results show that the temperature-dependent increase in structural disorder is greater around the Ta atoms in the CoCrTa system than it is around the Pt atoms in the CoCrPt system. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4496-4501 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Future 10 Gb/in.2 recording densities represent submicron trackwidths and sub-100 nm bit lengths. This requires extremely small magnetic switching units and very high coercivities of the media to satisfy the signal-to-noise ratio requirements. At the same time the question of magnetic thermal stability and the lack of transducers capable of performing at these densities makes it difficult to evaluate media. An uncoupled, highly uniform magnetic grain size of about 10 nm is a compromise toward maintaining an adequately low media noise and yet maintaining magnetic stability. Here we discuss current media construction, the detrimental role of substrate roughness, the role of new media structures and alloys on microstructure and magnetic properties as well as techniques for evaluating media performance prior to the availability of the required playback heads. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7311-7316 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Although it is well known that Cr underlayers sputter deposited on glass or NiP/Al substrates have either the (002) or (110) textures, the mechanism of the formation of the crystallographic textures is not clear. A model is proposed for the formation of the crystallographic texture of sputter-deposited Cr thin films. A systematic set of experiments has been carried out to test the model. It was found that the (110) texture, which is usually found in Cr thin films deposited on substrates without preheating, can form at elevated temperatures (250 °C) when deposited at low Ar pressure or by applying substrate bias. The initial stage of the texture formation was also investigated by using very thin Cr films. It was found that the (002) texture can be initiated directly on the substrate surface, while the (110) texture appears not to form directly on substrate surface, but rather as a result of film growth. The proposed model is consistent with the experimental results. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: CoCrTa/Cr thin films were prepared by rf diode sputtering onto canasite and glass substrates at various bias voltages from two targets of different compositions (Co82.8Cr14.6Ta2.6 and Co86Cr12Ta2). While Auger depth profile analysis indicates that there is some broadening at the CoCrTa-Cr interface, x-ray fluorescence spectroscopy reveals that changes in alloy composition due to the resputtering processes are even more prominent. For both targets, as the substrate bias increases the Co content in the films declines, and the magnetization decreases. The maximum film coercivity appears to correlate to the final film composition. By investigating the results from both targets, it is concluded that the coercivity reaches a maximum when the film composition is in the neighborhood of Co84Cr13Ta3. Thus, to optimize the coercivity different bias voltages are required for each target. Excessive substrate bias, however, leads to films with low magnetization and coercivity.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Gd1.6Bi1.4Fe3.8Ga1.2O12 garnet films for short wavelength magneto-optical recording are investigated. These films have high Faraday rotation (up to 1.3 °/μm), good corrosion resistance and good magnetic properties (Hc(approximately-greater-than)1 kOe with hysteresis loop squareness of 1) but poor noise performance. This paper shows that the noise is a result of the grain size being of the order of the recorded domain size and that the grain size and distribution are determined by the initial density of garnet nuclei. In the course of this study, it was discovered that these films contain a high density of Bi globules which precipitate out of the garnet matrix. It is believed that these globules contribute to the high coercivity of sputtered garnet films.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 4366-4368 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: B2 ordered FeAl films with a small, uniform grain size have been produced by rf diode sputter deposition on glass substrates. CoCrPt films grown on FeAl underlayers were found to have the (101¯0) lamellar texture. The in-plane coercivities (Hc) of the CoCrPt/FeAl films are comparable to those of the CoCrPt/Cr films and they can be further improved by inserting a thin Cr intermediate layer between the CoCrPt and the FeAl layers. By employing a MgO seed layer or a (002) textured Cr seed layer, (001) textured FeAl can be obtained. However, the (001) FeAl underlayer only induces a weak (112¯0) textured CoCrPt. Thus no improvement in Hc over those produced on unseeded FeAl underlayers was observed. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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