Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
63 (1993), S. 1848-1850
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Using pulsed laser deposition, YBa2Cu3O7−δ (YBCO) films ranging in thickness from 0.065 to 6.4 μm have been deposited on yttria-stabilized zirconia substrates with an intermediate layer of CeO2. The thinnest films have critical current densities of over 5 MA/cm2 at 75 K with zero applied field; as film thickness is increased, Jc decreases asymptotically to 1 MA/cm2. X-ray analysis of a 2.2-μm-thick film shows that the YBCO is predominantly c-axis oriented and textured in-plane, while a Rutherford backscattering spectrometry minimum channeling yield of ≈75% indicates that the film contains disordered material at this thickness.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.110653
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