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  • 1
    Electronic Resource
    Electronic Resource
    Structural and electrical studies of radio frequency sputtered hydrogenated amorphous silicon carbide films (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 7289-7294 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structural and electrical properties of radio frequency (rf) sputtered hydrogenated amorphous silicon carbide films are presented in this paper. Films were prepared with sputtering pressure Ps varied from 0.8 to 3 Pa, or with substrate temperature Ts varied from 100 to 300 °C. For films deposited with an argon plus hydrogen ambient, the deposition rate was found to increase with increase in Ps and decrease with an increase in Ts. For films prepared with an argon ambient only, the deposition rate increased slightly with an increase in Ps or Ts. The deposition rate was also approximately two to eight times higher when sputtering was carried out in an argon plus hydrogen ambient than in argon only. Infrared (IR), x-ray photoelectron (XPS), and Raman spectroscopies were employed in the structural analysis. The IR results showed that the Si–C bond gave the most prominent absorption peak and was affected by changes in Ps. The Si–H and SiHn stretching modes were observed in all films, and the amount of Si–H bonds NSi–H were found to increase as Ps or Ts was increased. The C–Hn stretching mode was absent in all films, and this was attributed to the low carbon content in these films.The Si–N stretching mode was suggested to contribute to the extra features between 800 to 1100 cm−1 in the IR spectra for films prepared at a higher Ps (3 Pa) or Ts (300 °C). The stoichiometry of silicon carbide and the film composition were determined by the XPS method. The carbon content of silicon carbide was found to be similar to the target composition and varied only slightly with changes in Ps or Ts. The Raman spectra showed that only the C–C bond can be detected in all of the films. From the electrical measurements, the film's conductivity was found to reduce from 4.21×10−9 to 4.35×10−11 Ω−1 cm−1 as Ps was increased from 0.8 to 3 Pa; and decreased from 3.81×10−9 to 1.31×10−8 Ω−1 cm−1 when Ts was raised from 150 to 300 °C. The conductivity was found to be related to NSi–H, with higher NSi–H resulting in lower conductivity. A comparison with data published in the literature suggested that rf sputtering technique was not effective in varying the carbon content in amorphous silicon carbide film. This technique, however, can be used to vary NSi–H and thus change the structural and electrical properties of the sputtered films. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360377
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  • 2
    Electronic Resource
    Electronic Resource
    Effect of rapid thermal annealing on the structural and electrical properties of a silicon-silicon oxide system (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4390-4394 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An investigation of the electrical and structural properties of rapid thermal annealed Czochralski silicon wafers has been carried out. The electrical properties examined here are the minority carrier lifetime, measured using the laser microwave photoconductance technique, and the donor concentration (Nd), determined by the four-point probe method. Thermal donors were intentionally introduced into the silicon and were found to be completely annihilated by the rapid thermal annealing (RTA) process. The minority carrier lifetime was found to increase significantly for wafers annealed at 900 and 1000 °C. It was concluded that due to the very short annealing time used in this work, a denuded zone was unlikely to form in silicon and be responsible for the increase in the lifetime. Infrared, x-ray photoelectron (XPS) and Auger electron spectroscopies were used for the structural analysis. Auger results showed that higher oxygen concentration could be found in a thicker layer of silicon in annealed wafers, as compared to the as-received, virgin sample. The XPS data showed that the SiO2:Si ratio increased from 0.28 for the virgin sample to 3.5 for wafers annealed at 1000 °C. It is suggested that the Auger and XPS data could be explained by considering oxygen outdiffused from the bulk of the silicon to the native oxide and the silicon next to the native oxide. We believe this is the first investigation of the effect of RTA on the behavior of oxygen and thermal donors, and its influence on the minority carrier lifetime of Czochralski silicon. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359844
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  • 3
    Electronic Resource
    Electronic Resource
    Effects of hydrogen and rf power on the structural and electrical properties of rf sputtered hydrogenated amorphous silicon carbide films (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 1611-1616 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effects of the rf power (100 to 600 W) and the hydrogen partial pressure (PH=0.15 to 0.6 Pa.) on the deposition rate and the structural and electrical properties of rf sputtered hydrogenated amorphous silicon carbide (a-Si1−xCx:H) films were investigated. The films were deposited in an argon plus hydrogen ambient. The deposition rate increased with increasing rf power, but decreased with increasing PH. The refractive index increases from 1.85–3.6 as the rf power increases from 100–600 W and from 2.8 to 3.5 as PH increases from 0.15–0.6 Pa. The optical gap increases from 1.5 to 2.15 eV as PH increases from 0.15–0.6 Pa, but decreases from 2.8–1.38 eV as the rf power increases from 100–600 W. The Si–C bond gave the most prominent absorption peak in the infrared spectra, and increased with increasing rf power but not affected by changes in PH. The Si–H bonds increases from 3.06×1021 to 1.64×1022 cm−3 as PH was increased from 0.15–0.6 Pa. The optical gap increases from 1.5–2.15 eV and the conductivity reduces from 7.3×10−9 to 1.9×10−11 Ω−1 cm−1 accordingly. No C–Hn stretching mode was detected in all the films and this was attributed to the low carbon content of the films. We conclude that rf sputtering technique is not effective in varying the carbon content in a-Si1−xCx:H films. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362959
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  • 4
    Electronic Resource
    Electronic Resource
    Characterization of corrosion products formed on a rapidly solidified Mg based EA55RS alloy (1996)
    Springer
    Journal of materials science 31 (1996), S. 4017-4023 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Surface characterization of the corrosion products formed on the surfaces of rapidly solidified Mg based EA55RS (Mg-5 wt% Al-5 wt% Zn-5 wt% Nd) extrusion immersed in a 3% NaCl solution saturated with Mg(OH)2 has been carried out using X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The surfaces of both pristine and corroded samples have been found to consist mainly of Mg(OH)2 and MgO. XPS and AES results show that Nd and Zn are not present on the surfaces of either pristine or corroded samples and depth profiling using SIMS shows that there is depletion of Nd on the surfaces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00352663
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  • 5
    Electronic Resource
    Electronic Resource
    Inborn errors of metabolism in Singapore (1995)
    Springer
    Journal of inherited metabolic disease 18 (1995), S. 341-346 
    Details
    ISSN: 1573-2665
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Summary Between 1992 and 1994 the Paediatric Metabolic Centre screened 403 patients for inherited metabolic disease. Seventeen patients were diagnosed, including 7 with organic acidurias, 5 with mucopolysaccharidoses, 2 with amino acid disorders, 2 with carbohydrate disorders and 1 with hyperlipidaemia. The ethnic distribution of disorders in Singapore is compared with incidences reported by others in this part of the world. It is likely that further studies will indicate which diagnostic or screening tests would best serve this community.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00710426
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  • 6
    Electronic Resource
    Electronic Resource
    Effect of alloying addition of Pr on the dissolution rate of melt-spun Mg in 3% NaCl solution (1998)
    Springer
    Journal of materials science 33 (1998), S. 1075-1081 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Melt-spun Mg-1 and 15 wt % Pr binary alloys were immersed in a 3% NaCl solution saturated with Mg(OH)2 for up to 72 h. The dissolution rate was evaluated by hydrogen evolution method. Surface characterization of the pristine and corroded surfaces has been carried out using X-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The surfaces of both the pristine and corroded samples were found to consist mainly of Mg(OH)2 and MgO. However, results of XRD and SEM showed that the dominant product formed on the corroded sample was Mg(OH)2. SIMS depth profiling showed that there was a depletion of Pr at the surfaces of Mg–Pr samples. © 1998 Chapman & Hall
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1004340618168
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  • 7
    Electronic Resource
    Electronic Resource
    Surface structures of fluoropolymer, polyolefin and polyester films after modification by graft polymerization (1994)
    New York, NY : Wiley-Blackwell
    Polymers for Advanced Technologies 5 (1994), S. 837-842 
    Details
    ISSN: 1042-7147
    Keywords: Polyolefin ; Fluoropolymer ; Polyester ; Graft Polymerization ; Surface structure ; XPS ; SIMS ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Pristine and argon plasma pretreated polytetrafluoroethylene (PTFE), polystyrene (PS), high-density polyethylene (HDPE) and poly(ethylene terrephthalate) (PET) films have been subjected to near-UV light-induced graft polymerization with water-soluble acrylamide (AAm), the sodium salt of styrene sulfonic acid (NaSS), acrylic acid (AAc) and N,N-dimethylaminoethylmethylacrylate (DMAEMA) monomers. The structure and composition at the substrate surface with grafted polymer were studied by angle-resolved X-ray photoelectron spectroscopy (XPS). In most cases, the density of surface grafting is enhanced by plasma pretreatment. For each polymer substrate with a substantial amount of grafting, the hydrophilic graft penetrates or becomes partially submerged beneath a thin surface layer of dense substrate chains. This stratified microstructure is consistent with the static secondary ion mass spectroscopy (SIMS) and Ar+ beam depth profiling results. The two latter techniques also suggest that when the grafted polymer has a bulky substituent, there is less efficient penetration of the grafted polymer below the surface.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/pat.1994.220051211
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  • 8
    Electronic Resource
    Electronic Resource
    Protonation of polyaniline by surface-functionalized polymer substrates (1995)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 56 (1995), S. 355-364 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The protonation of solution-coated emeraldine (EM) base by sulfonic and carboxylic acid groups on surface-functionalized low-density polyethylene (LDPE), high-density polyethylene (HDPE), polypropylene (PP), poly(ethylene terephthalate) (PET), and polytetrafluoroethylene (PTFE) films were characterized by X-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR) spectroscopy, and conductivity measurements. Surface functionalizations were achieved by sulfonation (for LDPE, HDPE, PP, and PET), by hydrolysis (for PET), and by near-UV-light-induced surface graft copolymerization with the Na salt of styrene sulfonic acid and acrylic acid (for all substrates). The efficiency of surface functionalization by graft copolymerization is substantially enhanced for substrates pretreated with O3 or Ar plasma. Protonation levels of 50% can be readily achieved for EM coated on sulfonic acid, but not carboxylic acid, functionalized surfaces. The extent of protonation, however, is also dependent on the microstructures of the modified substrate surfaces. In all cases, charge transfer interactions between the EM layer and the functionalized substrates readily result in good adhesion of the electroactive polymer on the polymer substrates to give rise to conductive surface structures. © 1995 John Wiley & Sons, Inc.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/app.1995.070560306
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  • 9
    Electronic Resource
    Electronic Resource
    Surface modification of polyimide films by graft copolymerization (1995)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 56 (1995), S. 1707-1713 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Surface modifications of polyimide (PI) films by Ar-plasma, O2-plasma, and O3 pretreatment and by near-UV light-induced graft copolymerization with water-soluable monomers, such as acrylamide (AAm), acrylic acid (AAc), and sodium salt of 4-styrenesulfonic acid (NaSS), have been carried out. The angle-resolved x-ray photoelectron spectroscopy (XPS) results show that surface pretreatment results in the formation of peroxide species on the polymer film surfaces and leads to a substantial enhancement of the density of surface graft. The XPS results further suggest that in the case where substantial grafting has taken place, the grafted polymer either forms a surface layer uniformly intermixed with the substrate chains, or a graft-rich surface layer in the case of sterically hindered migration of the graft. The resulting surface structures are further supported by dynamic water contact angle measurements. These surface structures are probably associated with the thermoset character of PI, as they differ from the stratified microstructures observed on most thermoplastic films after surface modification by graft copolymerization with hydrophilic monomers. © 1995 John Wiley & Sons, Inc.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/app.1995.070561302
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  • 10
    Electronic Resource
    Electronic Resource
    XPS Characterization of Surface Functionalized Electroactive Polymers (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 597-604 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Surface modification and functionalization of polyaniline (PAN) and polypyrrole (PPY) films were achieved by Ar plasma treatment, near-UV-induced graft copolymerization with acrylic acid (AAc) and covalent immobilization of an enzyme (trypsin). The compositions and structures of the modified and functionalized polymer surfaces were characterized by angle-resolved XPS. Argon plasma treatment results in minor oxidations of the carbon atoms but is accompanied by a significant decrease in the intrinsic oxidation state ([=N-]/[-NH-] ratio) of the polymers. Graft copolymerization with AAc readily gives rise to self-protonated PAN and PPY surface structures. The surface concentration of the grafted AAc polymer increases with increasing monomer concentration and near-UV irradiation time during grafting but decreases with increasing plasma pretreatment time. Covalent immobilization of trypsin on the AAc-polymer-grafted PAN and PPY films is facilitated by the use of water-soluble carbodiimide intermediate (WSC). The effective enzyme activity increases initially with increasing surface concentration of the grafted AAc polymer, but becomes saturated at moderate to high AAc polymer concentration.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
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