ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
The behavior of stacking faults with regard to Vf degradations and TEDREC phenomenafor 4.5 kV SiCGT have been investigated through the use of light emission images. Stacking faults,which cause Vf degradations, are expanded when current densities are increased. A novel phenomenaof Vf degradation reduction, TEDREC phenomena, was found, which can reduce degradation byincreasing operating temperature. It was observed for the first time that stacking faults becomeinactive by elevating temperatures to more than 150 oC in spite of existing stacking faults, which is afactor that contributes to TEDREC phenomena
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/20/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.600-603.1175.pdf
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