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  • 1
    Electronic Resource
    Electronic Resource
    Nanostructure of thin amorphous hydrogenated carbon films studied by positron annihilation and photoluminescence (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 404-410 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We deposited polymer-like a-C:H films using the plasma-enhanced chemical vapor deposition technique and characterized film microstructure by variable-energy positron lifetime spectroscopy, photoluminescence (PL), and UV-visible absorption spectroscopy. It was confirmed that PL occurs from a chromophore in a sp2 cluster as a result of fast recombination of a photoexcited electron-hole pair. Positron annihilation lifetime spectroscopy showed that positronium (Ps) formation takes place via electron-positron recombination in the sp3 matrix. The lifetime of ortho-positronium (o-Ps) in our a-C:H films was similar to that in polyethylene, indicating their polymer-like nature. The relative PL efficiency increased by about an order of magnitude with increasing film band gap from 1.3 to 3.4 eV, which can be related to the decreasing concentration of nonradiative centers. On the other hand, Ps formation was much less influenced by the band gap and nonradiative centers. Comparison of this result with that for polyethylene mixed with carbon-black nanoparticles, where a considerable reduction in Ps formation was observed, showed that nonradiative centers were of a different nature from the defects on the carbon nanoparticle surface. This work demonstrated the usefulness of positron lifetime spectroscopy combined with optical measurements to study the nanostructure of a-C:H. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1378063
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  • 2
    Electronic Resource
    Electronic Resource
    Design and manufacture of a 10-T superconducting wiggler magnet at TERAS : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1960-1963 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The 10-T wiggler is an iron-cored superconducting wiggler destined for Electrotechnical Laboratory's 800-MeV electron storage ring to enhance the available radiation. The design and manufacturing contract for this magnet was started in April 1990 and was preceded by a feasibility study. The major features of the magnet are described in the article. Also, the effect of the superconducting wiggler with high magnetic field on the stored electron beam has been simulated. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145770
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  • 3
    Electronic Resource
    Electronic Resource
    Nanoporous structure of sputter-deposited silicon oxide films characterized by positronium annihilation spectroscopy (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 1704-1706 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Positronium annihilation was applied to characterize the nanoporous structure of thin silicon oxide films sputter-deposited at different argon pressures ranging from 0.1 to 2.0 Pa. At higher argon pressures, the 3γ decay probability of ortho-positronium (o-Ps) was substantially enhanced. A comparison of this result with that obtained for capped samples indicated that: (a) 3γ annihilation is due to the intrinsic decay of o-Ps diffusing out from the film into vacuum and (b) films deposited at high argon pressures contain highly connected, open pores. Positron lifetime spectroscopy measurements on the capped films showed that the characteristic size of the pores can be as large as 2.6 nm, depending on the argon pressure. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1428787
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  • 4
    Electronic Resource
    Electronic Resource
    Slow positron study on dielectric-coated mirror for free-electron-laser experiments (1996)
    Springer
    Journal of radioanalytical and nuclear chemistry 211 (1996), S. 47-52 
    Details
    ISSN: 1588-2780
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract A positron lifetime study has been done on dielectric multilayer cavity mirrors for free-electron-laser experiments by the use of a variable-energy pulsed positron beam. A long-lived ortho-positronium component has been observed at low positron energy region, corresponding to the depth of the top amorphous SiO2 layer. The intensity of the positronium component correlates with the degradation and restoration of the mirrors. We discuss the relation between the positronium intensity and degradation mechanism of the mirrors. The present studies revealed that the slow positron lifetime technique is highly sensitive to the properties of the mirrors and is useful for the evaluation of the mirrors.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02036254
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  • 5
    Electronic Resource
    Electronic Resource
    Positron/positronium annihilation in nanocrystalline silicon thin films (1996)
    Springer
    Journal of radioanalytical and nuclear chemistry 211 (1996), S. 31-38 
    Details
    ISSN: 1588-2780
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract Positron and positronium annihilation investigations were applied to nanocrystalline silicon (nc-Si) thin films, for the first time. The nc-Si thin films with average grain diameters of 3–5 nm show intense blue luminescence at room temperature. The nanometer-sized Si crystallites formed in amorphous Si (a-Si) matrix give rise to this luminescence. Very highS-parameters up to 0.62 were observed in the as-grown a-Si thin film suggesting positronium formation in the a-Si layer. The average lifetime of the positrons in the a-Si was determined to be about 520 ps. TheS-parameters dropped significantly to 0.53 by crystallization of the thin film at 800 °C for 10 seconds, which was almost the same to the value observed in bulk Si (100) substrate. Further crystallization from 60 seconds to 1 hour showed smaller change in theS-parameters than that from the a-Si to 10 seconds. The large change in theS-parameters due to the annealing might be caused by the formation of Si nanocrystallites in a-Si matrix suggesting that positron is a sensitive probe for structural investigations of the nc-Si materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02036252
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  • 6
    Electronic Resource
    Electronic Resource
    Open spaces in the subsurface region of polyethylene probed by monoenergetic positron beams (1998)
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 36 (1998), S. 2597-2605 
    Details
    ISSN: 0887-6266
    Keywords: positron annihilation ; open space ; relaxation ; subsurface ; polyethylene ; Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Open spaces in the subsurface region (〈10 μm) of very low density polyethylene were probed by a monoenergetic positron beam. From measurements of Doppler broadening spectra measurements of the annihilation radiation and the lifetime spectra of positrons as a function of incident positron energy, the size of the open spaces in the region of 0-3 μm was found to be larger than that in the deeper region. This was attributed to the cooperative motion of large segments of molecules which is activated near the surface. After the freezing in of such motions (below 230 K), although the lineshape parameter S in the bulk was almost constant, S in the region of 0-3 μm decreased with decreasing temperature. This discrepancy was associated with the presence of the open spaces with an excess content and the resultant contraction of amorphous structure near the surface. © 1998 John Wiley & Sons, Inc. J. Polym. Sci. B Polym. Phys. 36: 2597-2605, 1998
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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