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  • 1
    Electronic Resource
    Electronic Resource
    Stopping powers of 200–3200 keV 4He and 550–1550 keV 1H ions in polyimide (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 3147-3154 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Accurate stopping powers of polyimide have been determined for mean energies (E) in the range of 200 keV≤E≤3200 keV for 4He ions and 550 keV≤E≤1550 keV for 1H ions, using the transmission method for foils with areal densities of 30–225 μg/cm2. The overall uncertainties of ∼2% are mainly due to the foil thickness determination. The present data have been parametrized and compared to results obtained by previous authors in the upper energy range and to various parametrizations found in the literature. The best description of the data is given by Bragg's rule calculations using parametrized elemental stopping powers that were derived from large data sets (deviations 〈2%). No support is found for the cores-and-bonds model showing deviations of 3%–5%, that may be due to the neglect of phase state effects. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363277
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  • 2
    Electronic Resource
    Electronic Resource
    Status report: preparing an ambient aerosol filter reference material for elemental analysis (1993)
    Springer
    Fresenius' Zeitschrift für analytische Chemie 345 (1993), S. 261-264 
    Details
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Summary For the elemental analysis of aerosol filter samples by X-ray techniques there is a lack of adequate reference materials (RM). No genuine aerosol matrix is available, which has been collected on membrane filters from ambient aerosol and can be distributed in the same physical form. It is possible to collect high-volume ambient aerosol samples, with a uniformity of 5% to 15%, in the elemental deposit ranges of 10 ng/cm2 to μg/cm2 within probed spots of only 4 mm diameter on suitable filter materials. An aerosol sampling campaign is being organized, aiming at the collection of large enough filter batches of aerosols of different origin, suitable for characterization by different analytical methods and compatible with X-ray fluorescence analysis (XRF). To a large extent, the production control - especially for the homogeneity of the elemental mass deposits - will be performed by particle-induced X-ray emission (PIXE) analysis on residual material without consuming any part of the candidate RM stock.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00322607
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  • 3
    Electronic Resource
    Electronic Resource
    Quantitative determination of chromium in conversion layers on aluminium by use of calibration samples (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 439-441 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120721
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  • 4
    Electronic Resource
    Electronic Resource
    Evaporated and implanted reference layers for calibration in surface analysis (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 253-258 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The potential of thin reference layers prepared by the Central Bureau for Nuclear Measurements, especially for calibration puposes in surface analysis, is presented. Our special preparation procedure is outlined, making use of an ultrahigh vacuum microbalance with the substitution principle of weighing applied. Our procedure of chracterizing the areal density of the evaporated layers is unique in that it provides for an optimal traceability to the SI unit of mass. Besides thin metal layers evaporated onto vitreous carbon substrates, which can serve for yield calibration in surface analysis, we are making use of thin layers as internal standards on implanted samples in order to perform high-accuracy determinations of the retained dose through Rutherford backscattering spectroscopy. After sensitive tests of the thickness uniformity, evaporated and implanted thin layers are made available as reference samples.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190149
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