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  • 1995-1999  (2)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4740-4754 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Shoulders have been observed in the measured semilogarithmic current-voltage (I–V) characteristics of high-efficiency passivated emitter and rear locally diffused silicon (Si) solar cells. An improved understanding is given of the mechanism proposed to cause these nonideal I–V curves. It is shown that this mechanism is due to the electrostatic behavior of free carriers at the Si/SiO2 interface of oxidized Si devices in which the Si adjacent to the oxide is depleted (or in some cases, inverted) at equilibrium, and results in saturation of the surface recombination rate. Two-dimensional numerical computer simulations are used to investigate this mechanism and its effect on cell performance. In addition, the simulations provide a means of estimating the extent to which lateral conduction in the rear surface channel also contributes to the observed recombination saturation in these cells. It is shown that ohmic limitation of lateral conduction occurs, however, the lateral current flows are negligible in comparison to the recombination currents due to the former mechanism. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Hoboken, NJ : Wiley-Blackwell
    Journal of Biomedical Materials Research 35 (1997), S. 191-197 
    ISSN: 0021-9304
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Medicine , Technology
    Notes: When transmission electron microscopy (TEM) is used to evaluate resin-dentin interface specimens for completeness of hybridization, the epoxy resin embedding medium that normally facilitates ultrathin sectioning may produce a secondary or artifactual hybrid layer. This secondary hybrid layer, composed of epoxy resin rather than adhesive resin, may fill the pores that remain as evidence of incomplete resin infiltration, obscuring the fact that they ever existed. In this study, resin-dentin interfaces produced by two dentin adhesive systems, Optibond (OPTI, Kerr) and Scotch-bond Multi-Purpose (SBMP, 3M), were comparatively investigated by TEM in epoxy-embedded and nonembedded non-demineralized sections. The hypothesis advanced was that no difference in ultramorphology of the hybrid layer would result from either specimen preparation method. The two adhesive systems were applied to four mid-coronal dentin disks per manufacturer's instructions. One half of each sample was processed following common procedures for TEM sample preparation with epoxy embedding, whereas the other half was not embedded but instead immersed in hexamethyldisilazane (HMDS), dried and mounted so that it protruded from a base of cold-cure acrylic resin. Each sample was then sectioned using a diamond knife in an ultramicrotome. With either means of preparation, a hybrid layer with a relatively uniform electron density and a loose collagen fibril arrangement with electron lucent interfibrillar channels was formed by OPTI. At the base of the hybrid layer, collagen fibrils were anchored in the underlying unaffected dentin, and no microporosities or gaps were observed. Similarly, whether SBMP was embedded or nonembedded, it was found to have a hybrid layer of variable electron density and an electron dense phase localized at the surface of the hybrid layer. No porosities were evident at the base of the hybrid layer. Thus, with either of the two adhesive systems, no ultrastructural difference in hybrid layer formation was observed between epoxy-embedded and nonembedded sections, and no direct evidence of ineffective resin-infiltration of the demineralized collagen scaffold was found. © 1997 John Wiley & Sons, Inc.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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