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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4740-4754 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Shoulders have been observed in the measured semilogarithmic current-voltage (I–V) characteristics of high-efficiency passivated emitter and rear locally diffused silicon (Si) solar cells. An improved understanding is given of the mechanism proposed to cause these nonideal I–V curves. It is shown that this mechanism is due to the electrostatic behavior of free carriers at the Si/SiO2 interface of oxidized Si devices in which the Si adjacent to the oxide is depleted (or in some cases, inverted) at equilibrium, and results in saturation of the surface recombination rate. Two-dimensional numerical computer simulations are used to investigate this mechanism and its effect on cell performance. In addition, the simulations provide a means of estimating the extent to which lateral conduction in the rear surface channel also contributes to the observed recombination saturation in these cells. It is shown that ohmic limitation of lateral conduction occurs, however, the lateral current flows are negligible in comparison to the recombination currents due to the former mechanism. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 363-370 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article presents measurements of the effective surface recombination velocity Seff at the Si–SiO2 interface of thermally oxidized p-type silicon wafers as a function of carrier injection level. The experiments cover a large range of injection levels and substrate resistivities, using the "microwave-detected photoconductance decay'' method. A minimum in Seff has been observed experimentally. The experimental results for Seff are compared with calculations based on an extended Shockley–Read–Hall formalism which includes surface band bending effects due to oxide charges.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7920-7930 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The principle of superposition forms the theoretical basis on which the comparison of illuminated and dark current-voltage (I-V) characteristics of solar cells depends. Two cases predicted from computer simulations where the superposition principle does not apply in silicon p-n junction solar cells are reported. These predictions are confirmed experimentally with measurements taken on existing high-efficiency devices, and cannot be accurately described by previous explanations for departures from this principle. The first case, which is the more important in terms of operation under 1 sun illumination, occurs in cells where recombination via defect levels (Shockley–Read–Hall recombination) with unequal electron and hole capture rates dominates the I-V characteristics. The second case is evident at small forward voltages in almost all silicon solar cells. It is shown that the former is due to a saturation in the recombination rate, while the latter is the result of a bias-dependent modification of the carrier concentrations across the p-n junction depletion region which is different under illumination from that in the dark. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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