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  • 1995-1999  (5)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    [s.l.] : Macmillian Magazines Ltd.
    Nature 401 (1999), S. 895-898 
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] The development of high brilliance X-ray sources coupled with advances in manufacturing technologies has led to significant improvements in submicrometre probes for spectroscopy, diffraction and imaging applications. The generation of a small beam spot size is commonly based on three ...
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2229-2231 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A very compact active x-ray mirror based on the properties of bimorph piezoelectric systems has been developed at the ESRF. The use of such a system as an x-ray focusing device has a number of advantages among which are compactness, low cost, and versatility. As a demonstrative test, a white focused beam of 35 μm has been obtained on an ESRF bending magnet beamline that corresponds to a demagnification of 1/18. A theoretical description of the system behavior is given, and compared with both finite element analysis and interferometric measurements. Examples of more advanced devices are discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2232-2234 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Regarding x-ray mirror design and fabrication, the unique properties of the ESRF source push specifications far beyond the obtainable limits of current technology. In order to keep control of the high quality of optical beamline components, interferometric based metrology capabilities are mandatory. This paper describes the ESRF metrology facility in which four complementary systems permit complete analysis of the quality of x-ray optical components. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2048-2052 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A first adaptive x-ray mirror prototype was built in 1992 and is now installed on the ESRF beamline 2 (Materials Science). This system consists of a water-cooled 1 m long Pt-coated Si mirror, supported by two rows of 11 piezoelectric actuators. The shape of the mirror is continuously monitored by an optical analyzer; its readout being used by a feedback loop in a real-time algorithm. A workstation associated to real-time electronics calculates the relevant parameters for driving the actuators as a function of both the desired shape and the possible thermal deformation due to the incident beam. Preliminary experiments carried out on the wiggler beamline showed that the system runs correctly: the feedback loop permits a control of the mirror shape in the microrad range at a frequency of 10 Hz. Various shapes (cylinder, parabola, or ellipse) can be produced at will to within the above accuracy. The different components of the device are described and the alignment and calibration procedures are discussed. The first results dealing with the properties of the reflected beam (size, divergence, and shape) versus both the calibration quality and the incoming power are presented. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 4061-4063 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The feasibility of a transmission x-ray microscope operating in the 3-7 keV photon energy range using phase zone plates (ZPs) has been tested. It has been demonstrated that, at a photon energy of 4 keV, structures smaller than 150 nm can be resolved with good contrast using exposure times in the second to minute range. A large diameter gold ZP was used as condenser and a tungsten ZP with an outermost zone width of 128 nm was used as a high spatial resolution imaging objective lens. Images with a field size of 10×10 μm2 were acquired using a charge coupled device camera optically coupled to a phosphor screen. The corresponding pixel size in the object plane was 70 nm. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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