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  • 1985-1989  (7)
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Material
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Investigation of hydrogenated amorphous carbon coatings for magnetic data storage media by atomic force microscopy (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1624-1626 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of hydrogenated amorphous carbon for magnetic data storage media have been examined by atomic force microscopy. The topography of several coatings has been imaged with a lateral resolution of a few nanometers. Histograms of the height distribution and rms values have been calculated to characterize the roughness of the surfaces quantitatively. Variations of these microscopic properties could be related to changes in the macroscopic behavior like friction and wear.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102218
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Nanometer scale structure fabrication with the scanning tunneling microscope (1987)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 244-246 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanometer scale structures have been produced on atomically flat surfaces of metallic glasses using the scanning tunneling microscope in the tunneling mode with enhanced local current densities and strong electric fields. Depending on the current and the electric field enhanced diffusion, local crystallization of the glassy state or Taylor cone formation of the locally molten surface can occur. These structures provide a potential means of studying the behavior of matter at nanometer dimensions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.98461
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy of a CoCr thin film (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 6001-6006 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present high-resolution magnetic force microscopy (MFM) images of a Co80Cr20 film with a thickness of 230 nm. We clearly observe a stripe domain structure with a domain width of 220 nm, the highest resolution of a periodic magnetic structure measured by MFM to this date, by measuring forces as small as 0.1 nN. The micromagnetic structure is compared to the morphology of the sample, which consists of vertical columns with an average cross section of about 40×60 nm2. The average surface roughness of this film did not exceed 12 nm on a 1-μm lateral scale. A magnetic fine structure of typically 50 nm width and more than 200 nm length is observed. Theoretical calculations of force traces are in reasonable agreement with experiment. A nonuniform sample magnetization, correlated to the morphology, has to be assumed to simulate the observed fine structure of force traces. Calculated images characteristically depend on the effective domain structure of the last 500 nm of the tip.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343628
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Hydrogenated amorphous silicon studied by scanning tunneling microscopy (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 4515-4517 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used scanning tunneling microscopy under ultrahigh vacuum conditions in order to study the local electronic properties, as well as the topographical and chemical structure of hydrogenated amorphous silicon. Local characteristics were measured and images of the topography, as well as simultaneously recorded images of the local tunneling barrier height, were obtained with subnanometer resolution. The experimental results demonstrate that chemical inhomogeneities on a subnanometer scale, which may be caused by the presence of hydrogen in these samples, can be detected in the local tunneling barrier height images.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.340148
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Observation of magnetic forces by the atomic force microscope (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 4293-4295 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample surface magnetic domains. The influence of the experimental conditions on the performance of the AFM as a magnetic profiling device is also discussed. Preliminary experimental results are reported.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339105
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Magnetic imaging by atomic force microscope (invited) (abstract) (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 2947-2947 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new method of imaging the surface of magnetic samples on a submicron scale is described and the observation of magnetic domain walls is presented. Measurements in air on a Co-Ni recording media, polycrystalline Ni foil and rapidly quenched alloys are shown. This magnetic microscope is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). Forces acting on a tip are recorded by the measurement of the deflection of a lever to which this tip is attached. In order to measure ultra small forces (less than nN), the spring constant of the lever has to be small and the deflection of the lever has to be measured with great sensitivity, i.e., by using interferometry or scanning tunneling microscopy (STM). The lever is made from ferromagnetic Ni foil with an integrated, electrochemically etched tip. Different measuring modes of the AFM are described. The images obtained by the AFM using a para- or ferromagnetic tip and by the STM are compared. Furthermore, the results obtained by the magnetic AFM on Co-Ni recording media are compared with previous studies by scanning electron microscopy with polarization analysis (SEMPA).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.340936
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    A study of the AgBr(111) and AgBr(100) surface by means of atomic force microscopy (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 4243-4247 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: For the first time, atomic force microscope measurements on the (111) and (100) surfaces of AgBr crystals are reported. We could image steps of varying sizes ranging from 0.9 nm to several nm. The lateral orientation of these steps could be determined by comparison with x-ray measurements. On the (100) surface, steps with the low index orientations 〈011¯〉 and 〈011〉 were observed. On the (111), surface steps were mainly oriented in the 〈12¯1〉 and 〈11¯0〉 directions. The most evident difference between these surfaces was that on the (111) surface no crossing steps occurred. This observation will be discussed in relation to the adsorption of dye aggregates on these crystals, which is of great importance for photographic emulsion technology.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343964
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    Paper (German National Licenses)
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