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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 48 (1989), S. 481-488 
    ISSN: 1432-0630
    Keywords: 68.55N ; 68.55 ; 68.35
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract In this work we describe the results of Rutherford backscattering spectrometry, sheet resistivity measurements, X-ray diffractometry and conversion electron Mössbauer spectroscopy performed on thin film Fe-Al bilayered samples submitted to high vacuum furnace annealing. Isothermal anneals were performed at 570 K for time intervals ranging from 60 to 600 min. It is demonstrated that the diffusion of Al into Fe is smaller than the diffusion of Fe into Al for temperatures below 600 K. Sequential isochronous thermal anneals of 60 min were performed at temperatures ranging from 570 to 870 K, in order to study the stability of the formed phases. The stable Fe2Al5 intermetallic compound formed at 570 K decomposes at about 650 K, and the FeAl6 intermetallic compound appears at temperatures around 750 K.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-0630
    Keywords: 68.35 ; 64.00 ; 73.40
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Thin film multilayers of Fe and Al with thicknesses ranging from 10 nm/2 nm to 10 nm/420 nm Fe/Al are used as starting structures to produce intermetallic phases by solid-phase reaction during high-vacuum thermal annealings. By measuring the relative concentrations of the reacting Fe and Al species nearby the growing interfaces and using the recently introduced concept of effective heat of mixing of binary thin-film metallic systems, a method is suggested to predict the phases to be obtained from different combinations of initial multilayer thickness and annealing temperature.
    Type of Medium: Electronic Resource
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