Bibliothek

feed icon rss

Ihre E-Mail wurde erfolgreich gesendet. Bitte prüfen Sie Ihren Maileingang.

Leider ist ein Fehler beim E-Mail-Versand aufgetreten. Bitte versuchen Sie es erneut.

Vorgang fortführen?

Exportieren
  • 1
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 2441-2446 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Previously reported results on deep level optical spectroscopy, optical absorption, deep level transient spectroscopy, photoluminescence excitation, and time resolved photoluminescence are reviewed and discussed in order to know which are the mechanisms involved in electron capture and emission of the Ti acceptor level in GaP. First, the analysis indicates that the 3T1(F) crystal-field excited state is not in resonance with the conduction band states. Second, it is shown that both the 3T2 and 3T1(F) excited states do not play any significant role in the process of electron emission and capture. © 1995 American Institute of Physics.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 2
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4039-4045 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The effect of growth temperature and thermal treatments on the luminescence properties of SiGe/Si heterostructures grown by rapid thermal chemical-vapor deposition is reported. While the excitonic luminescence of the strained Si1−xGex layer is observed in the samples grown above 700 °C, the signal completely disappears for deposition temperatures lower than 650 °C. After rapid thermal annealing, we show that a drastic improvement of the luminescence efficiency of the layers deposited at low temperatures is obtained. A spectral blue shift of the excitonic luminescence can also be observed and is interpreted in terms of interdiffusion of Si and Ge atoms during the heating process. The photoluminescence spectra after a rapid thermal annealing at 1050 °C have been used for the first time to perform an accurate study of the thermal stability of strained Si0.85Ge0.15 alloys. It is shown that when the layers are in a metastable state before annealing, the relaxation phenomenon leads to a photoluminescence signal which consists of both band-edge and dislocation-related recombinations. In this case, the strain relaxation is mainly attributed to the formation of misfit dislocations at the SiGe/Si heterointerface. In very thin SiGe layers, only the band-edge luminescence can be observed, but it is shifted to the high-energy side as expected by the interdiffusion model. Using a simple theoretical approach, this shift can be used to calculate the interdiffusion coefficient in good agreement with the literature data. © 1995 American Institute of Physics.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 3
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 2038-2043 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: We have studied by deep-level transient spectroscopy and deep-level optical spectroscopy n-type chromium-doped InP. We definitively confirm that the Cr2+/Cr3+ acceptor state is positioned at EC −0.4 eV in InP. We have measured for the first time the absolute values of the photoionization cross sections of Cr2+ in InP by deep-level optical spectroscopy. The σ0n cross section exhibits both a resonant and a nonresonant character. The former corresponds to the internal transition 5T2→5E of Cr2+, while the latter is attributed to the photoexcitation from the Cr2+ to the conduction band. The threshold of this transition at EC −0.41 eV indicates a very small Franck–Condon shift. The scales of the absolute photoionization values (σ0n) and photoneutralization (σ0p) cross sections towards the conduction and valence bands are the same, which seems to indicate no selection rules.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 4
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 3126-3130 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: We have studied p-type vanadium-diffused InP by deep-level transient spectroscopy. A level at 0.21 eV above the valence band is observed at a concentration comparable to that of vanadium. This level is interpreted as the V3+/V4+ donor state of vanadium in agreement with photoluminescence excitation experiments on n-type InP:V. Measurement of the photoneutralization cross section allows us to observe, for the first time, an excited state of a transition metal ion in resonance with the valence band. This observation confirms the charge state of the level that we have found.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 5
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4293-4302 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: A complete quantitative analysis of electrical and optical properties is carried out on the vanadium transition metal in semi-insulating and n type conductor Cd0.96Zn0.04Te crystals using deep level transient spectroscopy, deep level optical spectroscopy, and photoinduced current transient spectroscopy. Four deep levels are mainly detected, with activation energies at Ec−0.95 eV, Ec−0.78 eV, Ev+0.68 eV, and Ev+0.2 eV. Their electrical and optical characteristics (thermal and optical cross sections, concentrations, and apparent activation energies) are determined. The 0.68 eV hole level and the 0.95 eV electron trap are related to the vanadium doping. These two levels are proposed to be originated from the same defect that interacts with the valence and conduction band, respectively. We have demonstrated that the 0.95 and 0.78 eV electron traps present capture barrier energies with values of 0.2 and 0.15 eV, respectively. The observed resonance bands on the optical cross sections σno and σpo of the 0.95 eV level are attributed to d→d* internal transitions of the V2+(3d3) and V3+(3d2) ions on Cd sites, respectively. Based on the above result, the 0.95 eV level is formally identified to the V2+/V3+ single donor and its real thermal ionization energy locates it near the midgap at 0.75 eV below the conduction band. This level is shown to be the donor trap that explain the semi-insulating character of the V doped CdZnTe materials. It is shown also that the 0.78 and 0.95 eV play a key role in the photorefractive properties of the V doped CdZnTe crystals. © 2000 American Institute of Physics.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 6
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 3325-3329 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: By combining photoluminescence and optical deep-level transient spectroscopy measurements, we have investigated the presence of a native acceptor level H01 situated at 0.32 eV above the valence band, in n-type Si-doped liquid-encapsulated Czochralski GaAs grown in stoichiometric and Ga-rich conditions. The concentration of H01 decreases when increasing the [Ga]/[As] ratio up to a critical threshold of 1.3. For [Ga]/[As] ratio greater than 1.3, H01 disappears and another acceptor level, H02 (Ev+0.23 eV), is detected. H02 is identified as the double-acceptor level of the gallium antisite GaAs. Photoluminescence results show the presence of a high-intensity 1-eV band which disappears for [Ga]/[As] ratios greater than 1.2. The annihilation of this band is accompanied by the appearance of two emission bands centered at 0.95 and 1.2 eV. The dependence of the free-carrier concentration on the presence of H01 is interpreted in terms of a complex defect formed by a gallium vacancy and silicon impurity which can be the possible origin of this defect. Finally, the evolution of native electron traps present in these samples, with [Ga]/[As] ratio, is also interpreted to give more information about the origin of the EL6 center in GaAs.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 7
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 648-650 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The region beneath the interface of an InGaAs layer grown onto an undoped InP substrate by molecular beam epitaxy was investigated before and after rapid thermal annealing. Capacitance-voltage measurements revealed a depletion region in the underlying InP due to donor compensation that is mainly caused by the Fe-related Ec−0.63 eV-deep level observed by deep level transient spectroscopy.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 8
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 4207-4215 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The positions of the acceptor level of vanadium in GaAs, GaP, and InP are estimated. This level is found to be at about Ec−0.14 eV in GaAs and about Ec−0.8 eV in GaP. It is above the conduction band edge in InP. These positions in the three hosts are in agreement with the trends proposed by Ledebo and Ridley. The finding of a very high acceptor level of vanadium in GaAs does not allow to explain the semi-insulating behavior of GaAs:V. Other possible compensating centers are considered.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 9
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 1696-1698 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Deep level transient spectroscopy, deep level optical spectroscopy, and optical absorption experiments were carried out in n- and p-type Ti-doped GaP crystals grown by the liquid encapsulated Czochralski technique. The single acceptor level of substitutional titanium Ti3+/Ti2+ was identified by deep level transient spectroscopy at an energy of 0.50±0.02 eV from the conduction band. The Ti2+ intracenter transitions were detected by deep level optical spectroscopy and optical absorption about 0.63 and 1.03 eV. The Ti4+/Ti3+ donor level was found at about 1±0.2 eV from the top of the valence band. The position of these two levels is found in complete agreement with the position of titanium-related levels in GaAs and in InP.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 10
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 5554-5559 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Semi-insulating and n-type conductor titanium (Ti) doped CdZnTe has been investigated by deep level transient spectroscopy, deep level optical spectroscopy and photoinduced current transient spectroscopy. A main electron trap at 0.82 eV is detected and its electrical and optical characteristics are given. The σno optical cross section spectrum of this level exhibits a resonance band attributed to the internal transition of the Ti2+ ion in CdZnTe. Starting from this identification, this deep trap is formally proposed to be the Ti2+/Ti3+ single donor level. The semi-insulating properties of the CdZnTe:Ti are interpreted in relation to this deep donor. Finally, the impact of the optical cross sections σno and σpo of this level on the photorefractive behavior of CdZnTe crystal is also discussed. © 1998 American Institute of Physics.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
    BibTip Andere fanden auch interessant ...
Schließen ⊗
Diese Webseite nutzt Cookies und das Analyse-Tool Matomo. Weitere Informationen finden Sie hier...