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  • 1
    Electronic Resource
    Electronic Resource
    Formation of MnSb during the growth of MnSi layers in the presence of an Sb flux (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 4932-4935 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Structural and compositional analyses of a MnSi layer have been performed to elucidate the growth mechanism. The MnSi layer was grown by reactive deposition epitaxy in the presence of an Sb flux. The existence of Sb was found at the MnSi/Si interface and on the surface of MnSi layer by secondary ion mass spectrometry. In addition, x-ray photoelectron spectroscopy measurement shows that MnSb is formed on the surface of the grown MnSi layer. On the atomic scale, scanning transmission electron microscopy observations reveal the existence of an Sb–Mn–Sb structure at the interface between the MnSi layer and the Si substrate. The formation of the MnSb plays an important role for the improvement of crystalline quality of the silicide layer, acting both as a surfactant and as a compliant substrate for stress relief. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1461063
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  • 2
    Electronic Resource
    Electronic Resource
    Low resistance magnetic tunnel junctions and their interface structures (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7558-7560 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Effects of interface structure and oxidation state were studied in stacked magnetic tunnel junction (MTJ) structures with top and bottom antiferromagnetic layers to obtain optimum resistance and high tunneling magnetoresistance (TMR) ratios for read heads. The roughness of the NiFe surface and the Al coverage were significantly improved by introduction of O2 surfactant gas on the Ta-seed-layer surface, which increased TMR ratios of the MTJ with low resistance area (RA) products of less than 10 Ω μm2. Furthermore, it was found that avoidance of Ni oxidation and Co oxidation at the tunnel barrier interface is essential to obtaining high TMR ratios, and that a good Al coverage and Fe–oxide formation may enhance TMR ratios when Fe-rich magnetic materials are used. For the top-type and bottom-type structures, a TMR ratio of 12%–17% with RA products of 6–7 Ω μm2 was obtained, which provides sufficient performance for read heads. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1361054
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  • 3
    Electronic Resource
    Electronic Resource
    Reply to "Comment on ‘A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect' '' [J. Appl. Phys. 72, 3363 (1992)] (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1463-1464 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of thermal-diffusion charge on the x-ray energy response of silicon surface-barrier (SSB) detectors have generally been ignored; consequently, the SSB response has been believed to be analyzed using the thickness of the depletion layer alone. Our new theory on the SSB x-ray response [J. Appl. Phys. 72, 3363 (1992)] was prepared for addressing recent confusion on plasma x-ray analyses using SSB detectors [Rev. Sci. Instrum. 59, 1380 (1988); 61, 693 (1990); 63, 4850 (1992)]. This approach was made under the assumption of a dominant contribution of the diffusion-charge signal in the vicinity of the x-ray incident location because of the strong reduction of the x-ray produced charge within the thermal-diffusion length. In this report, the comparison between this approximation (having an approximated solution) and the exact numerical calculation (using an integral form) is carried out. Necessity and importance of such three-dimensional treatments for the data analyses as well as the design of multichannel semiconductor-array detectors developed for plasma x-ray tomography diagnostics are highlighted. Furthermore, for the total diffusing-charge amount, the calculated results from our theory and the values using the comment from Donolato agree well within the accuracy of 1%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354864
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  • 4
    Electronic Resource
    Electronic Resource
    A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 3363-3373 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An analytical method based on a new theoretical model for the x-ray energy responses of silicon surface-barrier (SSB) detectors has been proposed. This method may address a recent confusing issue in the x-ray detection characteristics of SSB semiconductor detectors; that is, the x-ray responses of SSB detectors as well as p-i-n diodes used in underbiased operations were recently found to be contrary to the commonly held belief that the x-ray sensitivity of an SSB detector is determined by the thickness of the depletion layer. The model presented includes a signal contribution from thermally diffusing charge that is created in the field-free substrate region within a diffusion length from the depletion layer along with a signal contribution from charge created in the depletion layer. This model predicts a large signal contribution from the charge-diffusion effect on the SSB responses to high-energy x rays. Formulas and calculated results supporting SSB calibration data have been represented. These analytical methods might be developed to apply the analyses and predictions of energy responses of various types of silicon detectors including p-i-n diodes as well as charge-coupled devices.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351458
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  • 5
    Electronic Resource
    Electronic Resource
    Near-field photoluminescence study of GaNAs alloy epilayer at room and cryogenic temperature (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1508-1510 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the spatial distribution of the optical properties of a GaNAs (N∼0.8%) epilayer to investigate the carrier recombination mechanism at both room temperature and cryogenic temperature using a near-field scanning optical microscope. A difference between the macro and near-field photoluminescence (PL) spectra at room temperature was not observed. At low temperature, we found spatial inhomogeneity of the optical properties and sharp features in the near-field PL spectrum. These findings indicate that the dominant emission mechanism changes from recombination of delocalized carriers at room temperature to recombination of localized carriers (excitons) trapped in the local potential minimum due to compositional fluctuation at low temperature. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1353815
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  • 6
    Electronic Resource
    Electronic Resource
    Reduced magnetoresistance in magnetic tunnel junctions caused by geometrical artifacts (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 3060-3062 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spuriously reduced magnetoresistance (MR) ratios have been observed in magnetic tunnel junctions in which a square contact portion with dimensions smaller than the width of the lead electrodes connects both the top and bottom lead electrodes. The phenomenon becomes apparent by measuring the magnetoresistance of the junctions with various sizes systematically varied under a fixed line width of the electrodes. Observed junction size dependence of resistance (R)×area(A) products and MR ratios were analyzed through finite difference calculation, and it was found that there exist junction sizes for which R×A products and MR ratios are larger and smaller, respectively, than the intrinsic ones. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1323740
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  • 7
    Electronic Resource
    Electronic Resource
    Room-temperature photoluminescence spectroscopy of self-assembled In0.5Ga0.5As single quantum dots by using highly sensitive near-field scanning optical microscope (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 73-75 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the optical properties of self-assembled In0.5Ga0.5As single quantum dots (QDs) at room temperature with a near-field scanning optical microscope. Successful detection of a weak photoluminescence (PL) signal from a single QD at room temperature could be achieved by using a double-tapered fiber probe having the advantages of both high collection efficiency and high spatial resolution. Through the precise examination of PL spectra of many QDs, including broadening and saturation behaviors, the homogeneous linewidth of the ground state emission is evaluated as from 9.8 to 14.5 meV. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125660
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  • 8
    Electronic Resource
    Electronic Resource
    Oxidative Stability, Structure, and Physical Characteristics of Microcapsules Formed by Spray Drying of Fish Oil with Protein and Dextrin Wall Materials (2003)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food science 68 (2003), S. 0 
    Details
    ISSN: 1750-3841
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Process Engineering, Biotechnology, Nutrition Technology
    Notes: : Maltodextrins and a highly branched cyclic dextrin (HBCD) were tested for their ability to serve as wall materials for microcapsules with proteins. HBCD or a maltodextrin of DE18 with sodium caseinate (SC) improved the oxidative stability of encapsulated fish oil; however, the DE18/SC wall system had 2 disadvantages: browning induced by the Maillard reaction and agglomeration. The oil load level and the selection of dextrin strongly affected the outer topography and the inner structure, as well as the ratio of the oil to dextrin on the surface of the microcapsules. It is stated that drying speeds of dextrin and oil load levels were shown to be likely related to the structural difference in the microcapsules.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-2621.2003.tb05755.x
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  • 9
    Electronic Resource
    Electronic Resource
    Multiplicity and Lattice Relaxation of DX Center in AlGaAs: Si Studied by Electron Emission Spectra under Pressure (1993)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 117-118 (Jan. 1993), p. 447-452 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/59/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.117-118.447.pdf
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  • 10
    Electronic Resource
    Electronic Resource
    Characteristics of Laser Speckle Measurement of Tooth Roughness (2004)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 261-263 (Apr. 2004), p. 1581-1586 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: This study is concerned with the fundamental characteristics of a new nondestructive measuring technique of the tooth roughness with precisely. In the dental clinics, the estimation of roughness of tooth surfaces with a hand explorer is one of the important tests for the finishing the crown re-shaping and resin fillings. If the tooth surface is rough enough to hold dental plaque, it occasio-nally causes dental diseases around it. Therefore, it is important to measure the roughness of the tooth surfaces for the prevention of furthermore distraction of the tooth. Laser speckle measurement is used as an evaluation method for objectively measuring the surface roughness with non-contact. In this study, a laser speckle measurement system for measuring the surface roughness is constructed. Comparison measurement is carried out for the tooth pieces with the various unidirectional roughness and the metallic test pieces with the standard roughness. The experimental results using the actual measuring system show some important points as follows. Firstly, there is a good correla-tion between the laser speckle pattern and the tooth roughness as well as that of the metallic test pieces. Secondly, the reflection from the tooth shows a different tendency in comparison with the reflection from the metallic test pieces
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/47/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.261-263.1581.pdf
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