Electronic Resource
Amsterdam
:
Elsevier
Microelectronic Engineering
14 (1991), S. 109-120
ISSN:
0167-9317
Keywords:
Electron beam testing
;
VLSI
;
internal nodes
;
measurement
;
power supply
;
switching noise
;
voltage bounce
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0167-9317(91)90158-A
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