ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Recent developments of the insertion devices have made it possible to utilize intense hard x rays for precise Compton-profile measurements. A Compton profile of Si (110), which is measured using 29.5-keV synchrotron-radiation x rays, is shown as an example of a precise measurement having a momentum resolution of 0.084 a.u., the best resolution ever achieved. A promising plan is presented on magnetic electron Compton-profile measurements using circularly polarized 60-keV x rays from a newly developed multipole wiggler in the 6-GeV accumulation ring at KEK as an elliptically polarized source.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141054
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