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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 7012-7017 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the influence of the (001) GaAs substrate preparation on the first stages of ZnSe heteroepitaxial growth by molecular beam epitaxy. We show that three different GaAs reconstructions occur depending on the ex situ substrate preparation, the Se residual pressure in the growth chamber and the temperature of heating. After deoxidation, an epiready substrate leads to a (2×1)-reconstructed surface at high temperature (∼600 °C) which turns into an unreconstructed surface when cooling down to the growth temperature (280 °C). An etched substrate, on the other hand, exhibits a (2×3) or a (4×3) reconstruction depending on the temperature reached during deoxidation. Both reconstructions are stable upon cooling down to the growth temperature. Direct nucleation of ZnSe on such deoxidized substrates leads to three-dimensional (3D), quasi two-dimensional (2D) and purely 2D growth modes on the unreconstructed, (2×3) and (4×3) reconstructed surfaces, respectively. Very pronounced oscillations of the reflection high-energy electron diffraction intensity are observed during nucleation on the (4×3) surface. Excellent agreement is obtained between simulated and experimental x-ray rocking curves for pseudomorphic layers grown on a (4×3) starting surface. In addition, their low-temperature photoluminescence spectra are dominated by free exciton recombinations without any defect-related line. Our results thus demonstrate that we have achieved a substantial improvement of ZnSe heteroepitaxy on bare GaAs substrates. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 1005-1009 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the recombination mechanisms of minority carrier lifetime in indium-doped layers of (211)B Hg1−xCdxTe(x ≈ 23.0% ± 2.0%)n-type grown by molecular beam epitaxy. Measured lifetimes were explained by an Auger limited band-to-band recombination process in this material, even in the extrinsic temperature region. Frequently, in some of the layers, a combination of the band-to-band recombination mechanisms together with recombination at the Shockley–Read single level 33 to 45 meV below the conduction band was necessary to explain the measured data. Results indicate that these defects have acceptorlike characteristics and their origin is related to Hg vacancies.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nonequilibrium electron distributions and phonons in CdTe have been studied by transient picosecond/subpicosecond Raman spectroscopy at T=300 K. Our experimental results show that for photoexcited electron–hole density of n(approximately-equal-to)1018 cm−3, the electron distributions can be reasonably well described by Fermi–Dirac distribution functions with effective electron temperature substantially higher than the lattice temperature. From an ensemble Monte Carlo analysis of the nonequilibrium phonon population as a function of photoexcited electron–hole pair density, the LO phonon lifetime in CdTe has been deduced to be τ(approximately-equal-to)0.75±0.25 ps. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2983-2989 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigate by high-resolution x-ray diffraction (HRXRD), temperature-dependent photoluminescence (PL) and reflectivity spectroscopies, and low-temperature selective-photoluminescence spectroscopy ZnSe single crystals grown by solid-phase recrystallization. HRXRD reveals the high structural perfection of the samples which exhibit rocking-curve linewidths in the 15–20 arcsec range. The low-temperature PL spectra are dominated by the so-called Ideep1 excitonic line, a neutral-acceptor bound-exciton line I1, the free-exciton emission FX, and the n=2 excited state of FX. We identify the main residual impurities to be Li acceptors. Donor–acceptor pair bands are very hardly detected at low temperature which indicates a low donor content. A major characteristics of these samples is the quasi-absence of any Cu-related deep emission which generally plagues the PL spectra of bulk ZnSe. Consequently, Ideep1 is ascribed to Zn-vacancy–donor complexes. Finally, from the temperature dependence of the PL emission and reflectivity, the band-gap energy of bulk ZnSe is found to linearly shrink with the temperature above 80 K at a rate of −4.3×10−4 eV K−1. The room-temperature gap is estimated to 2720±2 meV. Our results indicate that solid-phase recrystallization produces ZnSe samples with the highest structural quality and purity achievable at present time. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 2980-2983 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Hg1−xZnxTe-CdTe strained layer superlattices were grown by molecular-beam epitaxy. Their structural properties and interplay with a CdTe buffer layer were investigated with transmission electron microscopy. There is an order of magnitude reduction in the density of threading dislocations in the superlattice compared with the CdTe buffer layer. The reduction is accomplished by using the lattice-mismatch-induced strain to bend threading dislocations over into the superlattice-buffer layer interface. The magnitude of the reduction agrees well with predicted values for this system.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 283-286 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Infrared photoluminescence measurements have been made of a number of HgTe-CdTe superlattice samples as a function of temperature from liquid He to room temperature. The experimental results are compared with calculations of the band gap of these materials and the effects of layer thicknesses, valence-band offset, effective mass, and Hg in the CdTe layers are investigated. The data are in reasonable agreement with the calculations for zero (or small) valence-band offset and no Hg in the CdTe layers.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 1359-1363 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigate here the influence of the crystallographic orientation of the CdTe substrate on the condensation coefficients of Hg, Cd, and Te during the growth of Hg1−xCdxTe and CdTe by molecular-beam epitaxy. We show that the Hg condensation coefficient is strongly influenced by the orientation. A CdTe (1¯1¯1¯)B face requires about one order of magnitude less mercury than a (111)A face when growth occurs at 185 °C. Whereas for a CdTe(100) face, the Hg condensation coefficient falls in between. Even though the effect is less dramatic for the condensation coefficient of cadmium, a similar tendency is observed. These results can be explained in terms of the bonding of the surface atoms and confirm once again that the surface plays an important role in the molecular-beam-epitaxial growth process.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 5115-5119 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Transmission electron microscopy and high resolution x-ray diffraction are used to characterize defects in ZnO layers grown by plasma-assisted molecular-beam epitaxy on (0001) sapphire. Two- and three-dimensional types of growth modes are described and the observed mosaic structure is analyzed in each case. It is found that two-dimensional layers exhibit a roughness as low as 6 nm. Their subdomains have small lateral coherence lengths and a mean in-plane misorientation of ±0.4°, leading to an important dislocation density of 1–4×1010 cm−2. On the contrary, it is demonstrated that, through numerous interactions between dislocations, the three-dimensional growth mode leads to a better structural quality with a larger lateral coherence length and a smaller in-plane mosaic spread of ±0.07°. The total dislocation density is consequently reduced by 1 order of magnitude down to 3–5×109 cm−2 and the radical modification of the structure results in a change of the dislocation distribution. Our results thus demonstrate that two-dimensional growth mode and low full width at half maximum for symmetric x-ray diffraction are a not reliable indicator of a good structural quality. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A photoconductor array was made using molecular-beam epitaxy (MBE) grown CdTe. CdTe has been found to be an excellent material for high-energy photon detection. The objective is to develop an array detector with high efficiency and fast response toward x rays. There is considerable interest in the development of new x-ray detectors for use in the new synchrotron-radiation sources. Photoconductor arrays with gaps ranging from 5 to 50 μm between elements and 100 μm pitch size have been fabricated. The temporal response of the detectors was measured using 100 fs Ti:sapphire laser pulses. The temporal response of the photoconductor arrays is as fast as 21 ps rise time and 38 ps full width half maximum (FWHM). Spatial and energy responses were obtained using x rays from rotating anode (ANL) and synchrotron-radiation sources (NSLS, beam line X-18 B). The spatial resolution of the photoconductor obtained was 75 μm FWHM, for a 50 μm beam size. The best results were obtained for those arrays with the best crystal qualities. Linear response up to an energy of 15 keV was observed. Also observed was that a substantial number of x-ray photons were effectively absorbed within the MBE CdTe layer. The array detector did not show any evidence of radiation damage after x-ray exposures of several days. When the detector is cooled to 230 K the signal-to-noise ratio is improved by more than an order of magnitude. These results demonstrate that MBE grown CdTe is a suitable choice to meet the detector requirements for synchrotron-radiation applications. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 1783-1785 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structural properties of [001] ZnTe epitaxial layers grown on [001] GaAs substrates were investigated by transmission electron microscopy. The layers were deposited by molecular-beam epitaxy with thicknesses ranging from 50 to 1800 nm. The layers can be divided into three distinct regions of dislocation arrangements above the interface. The interface consists of an array of misfit dislocations. The separation of these dislocations is about 54 A(ring) and is independent of layer thickness. The first region extends 300 nm towards the surface and consists of a tangle of dislocations. The density of these dislocations increases with layer thickness. The second region, between 600 and 1300 nm above the interface, was found to contain a low density of dislocations. Above 1300 nm, the third region, the dislocation density surprisingly increases again and in addition Te precipitates are detected near the top surface.
    Type of Medium: Electronic Resource
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