Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
74 (1999), S. 3782-3784
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Synchrotron x-ray diffraction measurements have been made on hexagonal crystal Ti3SiC2 under pressures up to 61 GPa and at room temperature. No phase transition was observed within the pressure range studied. Both the a and c axes exhibited decreases with pressure, accompanied by a decrease in the c/a ratio to about 50 GPa, beyond which the ratio increased. The bulk modulus deduced from the volume-versus-pressure data was 206±6 GPa (with its pressure derivative 4.0±0.3), being close to that of TiC. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.124178
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