Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
78 (1995), S. 4793-4795
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Absorption, photocurrent, and infrared reflectivity spectra of the polycrystalline β-FeSi2 thin films in relation to the Si substrate temperature are presented. The photocurrent spectra involving both the fundamental interband, extrinsic defect transitions of β-FeSi2 and the intrinsic transitions of Si substrates are observed. Both the absorption and photocurrent measurements show the direct gap nature. A simple recombination model is proposed to account for the photocurrent results. We show that better quality β-FeSi2 films can be achieved at higher substrate temperature. The simplicity, sensitivity, and reliability of the photocurrent measurements for studying β-FeSi2 are well demonstrated. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.359761
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