Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
67 (1995), S. 2542-2544
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The structure of spark-processed silicon was examined in a comparative study of optical micrographs utilizing ultraviolet laser light and electron beams for excitation. Whereas the photoluminescence (PL) was found to be dominantly generated in granular structures near the surface, the cathodoluminescence (CL) mainly propagates from holes which were created during the preparation process. PL and CL spectra are not identical in their spectral distributions. Low temperature luminescence measurements for both excitation modes reveal a high degree of local disorder. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.114452
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