ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The TFTR x-ray imaging system (XIS) is an array of 64-Si surface barrier diodes which image the plasma poloidally. Special absorber foils have been installed to permit measurement of electron temperature Te with 〈100-μs time resolution along 10–30 chords. The technique uses the ratio of x-ray fluxes transmitted through two different foils, which depend mainly on Te. Simulations show that strong line radiation can change this ratio. To correct for these effects, special beryllium–scandium filters are employed to select the line-free region between 2 and 4.5 keV. Separate filter pairs allow correction for strong L line radiation as well as Ti or Ni Kα emission. The Te determination is based on simulations. Comparison of results with Te values from the electron–cyclotron emission and x-ray pulse height analysis diagnostics is presented.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138186
