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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1160-1164 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A detector setup with three LN-cooled Si(Li) diodes is used to measure soft x-ray spectra (0.8–20 keV) emitted from the inside walls of the PDX vessel during the plasma discharge. The setup is part of a pulse-height-analysis system, which is used to measure the plasma and wall radiation simultaneously at five different radial positions. The wall and the plasma radiation are measured under different plasma conditions (e.g., OH and neutral beam heating). The wall radiation is very much increased during the neutral beam heating, with an enhancement factor of at least 10 over the OH wall radiation. Since we measure the plasma and the wall radiation at the same time, the measurements allow the conclusion that the wall radiation can be attributed essentially to fluorescence (line radiation, e.g., Ti-Kα) and scattering (continuum part of the wall radiation spectrum). The fluorescence and the scattering are both caused by soft x-ray radiation flux coming from the plasma. There seems to be no need to invoke other, more exotic causes for the wall radiation, for example, charge particle bombardment of the wall.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A bent quartz-crystal spectrometer of the Johann type with a spectral resolution of λ/Δλ= 10000–25000 is used on the Tokamak Fusion Test Reactor (TFTR) to determine central plasma parameters from the spectra of helium-like and lithium-like metal impurity ions (Ti, Cr, Fe, and Ni). The spectra are observed along a central radial chord and are recorded by a position-sensitive multiwire proportional counter with a spatial resolution of 250 μ. Standard delay-line time-difference readout is employed. The data are histogrammed and stored in 64 K of memory providing 128 time groups of 512-channel spectra. The central ion temperature and the toroidal plasma rotation are inferred from the Doppler broadening and Doppler shift of the Kα lines. The central electron temperature, the distribution of ionization states, and dielectronic recombination rates are obtained from satellite-to-resonance line ratios. The performance of the spectrometer is demonstrated by measurements of the Ti xxi Kα radiation.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 847-847 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A detector setup with three LN-cooled Si(Li) diodes is used to measure soft x-ray spectra (0.8–20 keV) emitted from the inside walls of the PDX vessel during the plasma discharge. The setup is part of a pulse-height-analysis system, which is used to measure the plasma and wall radiation simultaneously at five different radial positions. The wall and the plasma radiation are measured under different plasma conditions (e.g., OH and neutral beam heating). The wall radiation is very much increased during the neutral beam heating, with an enhancement factor of at least 10 over the OH wall radiation. Since we measure the plasma and the wall radiation at the same time, the measurements allow the conclusion that the wall radiation can be attributed essentially to fluorescence (line radiation, e.g., Ti-Kα) and scattering (continuum part of the wall radiation spectrum). The fluorescence and the scattering are both caused by soft x-ray radiation flux coming from the plasma. There seems to be no need to invoke other, more exotic causes for the wall radiation, for example, charge particle bombardment of the wall.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 4
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A bent quartz-crystal spectrometer of the Johann type with a spectral resolution of λ/Δλ= 10000–25000 is used on the Tokamak Fusion Test Reactor (TFTR) to determine central plasma parameters from the spectra of helium-like and lithium-like metal impurity ions (Ti, Cr, Fe, and Ni). The spectra are observed along a central radial chord and are recorded by a position-sensitive multiwire proportional counter with a spatial resolution of 250 μ. Standard delay-line time-difference readout is employed. The data are histogrammed and stored in 64 K of memory providing 128 time groups of 512-channel spectra. The central ion temperature and the toroidal plasma rotation are inferred from the Doppler broadening and Doppler shift of the Kα lines. The central electron temperature, the distribution of ionization states, and dielectronic recombination rates are obtained from satellite-to-resonance line ratios. The performance of the spectrometer is demonstrated by measurements of the Ti xxi Kα radiation.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 827-829 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The TFTR x-ray imaging system (XIS) is an array of 64-Si surface barrier diodes which image the plasma poloidally. Special absorber foils have been installed to permit measurement of electron temperature Te with 〈100-μs time resolution along 10–30 chords. The technique uses the ratio of x-ray fluxes transmitted through two different foils, which depend mainly on Te. Simulations show that strong line radiation can change this ratio. To correct for these effects, special beryllium–scandium filters are employed to select the line-free region between 2 and 4.5 keV. Separate filter pairs allow correction for strong L line radiation as well as Ti or Ni Kα emission. The Te determination is based on simulations. Comparison of results with Te values from the electron–cyclotron emission and x-ray pulse height analysis diagnostics is presented.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 6
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The x-ray pulse-height analysis (PHA) diagnostic uses a liquid-nitrogen cooled array of 5 Si(Li) and one HpGe detectors to do time-resolved (5–100 ms) x-ray spectroscopy of the central horizontal chord of the Tokamak Fusion Test Reactor (TFTR) plasmas in the 1–50-keV range. Central electron temperature Te and concentration of medium and low-Z impurities are derived from the spectra. Remotely selectable absorber-foil arrays provide selection of the energy range. Fixed and movable aperture arrays allow approximate equalization of count rates in different energy bands and extend dynamic range. Amplifier pulse shapes are approximately triangular. Main amplifier peaking time is 4 μs yielding 230-eV FWHM at 5.9 keV. Pileup inspection times are selectable at 0.13, 0.4, or 0.9 μs. Throughput is up to 42 kHz. The PHA has been used to study temperature and impurities over a wide range of TFTR operational parameters. Dramatic variations in metal impurities with density, plasma current, and major radius have been observed.
    Type of Medium: Electronic Resource
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