Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
53 (1988), S. 2039-2041
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
Freshly cleaved (001) surfaces of single crystalline PbS were bombarded by 8 keV Kr+ ions at a dose of 3×1012 cm−2. Atomically resolved scanning tunneling microscopy (STM) images were taken showing damaged areas due to individual ion impacts. Analysis of a STM image shows a shallow impact crater, a stacking fault, displacement of Pb2+ and S2− ions from their regular surface sites, and migration of interstitials to the surface.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.100312
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