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Time-of-flight Thomson backscattering technique for large fusion devices (1985)

Salzmann, H. ; Hirsch, K. ; Gruber, J. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 56 (1985), S. 1030-1032

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: The application of 180° Thomson scattering to the JET tokamak for measuring electron temperature and density profiles is discussed. Spatial resolution along the laser beam is achieved by the use of subnanosecond laser pulses and high-speed detection allowing time-of-flight measurements. Gating tests of MCP photomultiplier and measurements of the stray light level in a full-scale optical setup show that the severe stray light problem in a backscatter geometry can be handled. Tests of a frequency-doubled iodine laser system are reported which demonstrate that a 1-pps operation of the system is feasible.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1138258

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