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  • 1995-1999  (4)
  • Polymer and Materials Science  (3)
  • Infant  (1)
  • 32.80.Fb
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    European radiology 6 (1996), S. 700-703 
    ISSN: 1432-1084
    Keywords: Thymus gland ; Ultrasonography ; Infant
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract A new method of measuring the size of the thymus in infants less than 1 year of age is presented. The width of the thymus was measured in a transverse image while the area of the largest lobe was assessed in a longitudinal image. The thymic index was then defined as the product of these two values. Intra-and interobserver variation analysis were performed in 23 infants. Each infant was scanned alternately by both of two radiologists, and later the same day the measurements were repeated. The mean differences between the first and second measurements (intraobserver variation) were −0.25 (2 SD 7.56) and −1.13 (2 SD 10.80), respectively, for the two observers. The mean difference between the first measurements of the two observers (interobserver variation) was 1.47 (2 SD 9.39). In a postmortem study of 12 infants the thymic index measured by sonography showed an acceptable correlation to the actual volume (c = 0.80) and weight (c = 0.87) of the thymus. In conclusion, our sonographic estimate of the volume of the thymus, the thymic index, in infants under 8 months of age seems to be easy, reliable and reproducible.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 717-722 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analytical correction method is proposed to eliminate the problems resulting from numerical Fourier transformation of functions with a broad background. The method incorporates the analytically known or observed asymptotic behaviour into the numerical procedure. The applicability and high accuracy of the background correction method is illustrated by application to the analysis of reflected electron energy-loss spectra.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 753-763 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The accuracy by which an unknown concentration profile can be found by analysis of XPS spectra is investigated theoretically by analytical and numerical techniques. The problem of determining the profile is reformulated as an optimization problem. By use of analytical techniques we obtain qualitative statements about the depth resolution and we derive fundamental relationships between the different parameters that indicate their relative importance. In order to illustrate the various dependencies of the variability of the model parameters, we derive analytical expressions for the standard errors of the model parameters for two simple models: a dalta layer and an exponentially decreasing profile. Furthermore, the complete probability distribution of the model parameters for a rectangular model is investigated numerically.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 23-27 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that the accuracy by which a concentration-depth profile can be estimated from the inelastic background of an XPS spectrum is dramatically improved by using two-dimensional (2D) data. The energy loss distribution of the photoelectrons for several values of the detection angle, or the energy of the excitation source, are treated as a single 2D data set. The resolution of the depth profile estimated from this set is far better than can be obtained from any single XPS spectrum.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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