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  • 1
    Electronic Resource
    Electronic Resource
    Deep level transient spectroscopy of irradiated p-type InP grown by metalorganic chemical vapor deposition (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 1435-1439 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Results are presented of a deep level transient spectroscopy study of radiation-induced defects in p-type (Zn-doped) InP grown by metalorganic chemical vapor deposition. Three major hole traps (H3, H4, and H5) and two electron traps (EA and EB) were observed. The electron trap structure in particular is significantly different from that reported in the literature for p-type InP grown by other methods. Activation energies of 0.22 eV (EA) and 0.76 eV (EB) have been measured, and capture cross sections (σ∞) of 4.4×10−15 cm2 (EA), and 1.4×10−12 cm−2 (EB) have been determined. The H5 center has a thermally activated capture cross section with an energy barrier of 0.35 eV. The measured injection annealing rate of the primary hole trap (H4) was different than previously observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347284
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  • 2
    Electronic Resource
    Electronic Resource
    Radiation-induced reverse dark currents in In0.53Ga0.47As photodiodes (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 7244-7249 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The reverse dark current-voltage (dark I-V) curves of InGaAs photodiodes have been measured as a function of temperature following irradiation with 1-MeV electrons. Prior to irradiation, the I-V curves are well described by a diffusion term alone indicating that the junctions are of good quality. Irradiation produces a large increase in the generation current which can be modelled as resulting from a single defect center with an energy Ec−0.29 eV. Such a defect center called E2 has been detected using deep level transient spectroscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354012
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  • 3
    Electronic Resource
    Electronic Resource
    Time dependence of radiation-induced generation currents in irradiated InGaAs photodiodes (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1629-1635 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The annealing behavior of the reverse bias current-voltage curves of 1 MeV electron irradiated In0.53Ga0.47As photodiodes has been measured at 300 K. The observed decay is shown to be correlated with the reduction of the E2 peak height with time, as measured by deep level transient spectroscopy. The reverse current is found to decay with a logarithmic time dependence, which can be explained by a model in which the annealing of the E2 defects is controlled by a distribution of thermal energy barriers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354812
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  • 4
    Electronic Resource
    Electronic Resource
    Effect of carrier concentration on the properties of irradiation-induced defects in p-type indium phosphide grown by metalorganic chemical vapor deposition (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 4201-4207 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Deep-level transient spectroscopy has been used to monitor the effect of carrier concentration on the properties of radiation-induced defects in InP n+p mesa diodes grown by metalorganic chemical vapor deposition. The activation energy Ea for hole emission from H4 and H5 centers and the injection-enhanced annealing rate of H4 at 200 K have been measured as a function of carrier concentration NA over the range ∼1×1016– 4×1017 cm−3. The measured values of Ea decrease with increasing NA in a way that can be semi-quantitatively explained by a combination of the Frenkel–Poole effect and phonon-assisted tunneling produced by the electric field in the junction. The results suggest that hole emission from H4 and H5 centers takes place to maxima in different valence bands. The injection-enhanced annealing rate of H4 centers increases with increasing NA at low concentrations, but approaches a maximum value near NA ∼ 1017 cm−3, indicating a limiting dopant (Zn) concentration for impurity-enhanced defect annealing.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351386
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  • 5
    Electronic Resource
    Electronic Resource
    Deep level transient spectroscopy study of proton irradiated p-type InP (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 6488-6494 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A deep level transient spectroscopy study of proton irradiation induced defects in n+p InP mesa diodes grown by metalorganic chemical vapor deposition is reported. In contrast to results reported for InP grown by other methods, 3 MeV proton irradiation produced a DLTS spectrum similar to 1 MeV electron irradiation with the addition of two new peaks. Six majority carrier peaks: HP1(Ea=0.15 eV), H2(Ea=0.20 eV), H3(Ea=0.30 eV), H4(Ea=0.37 eV), H5(Ea=0.54 eV), and H7(Ea=0.61 eV) and three minority carrier peaks: EA(Ea=0.26 eV), EB(Ea=0.74 eV), and EC(Ea=0.16 eV) were detected. The H5 peak displayed a thermally activated capture cross section and a dependence of peak height on injection level. Isothermal annealing at 375 K was performed and thermal annealing rates are presented. Low temperature (200 K), minority carrier injection annealing rates are also presented. For most of the defects, a significant residual concentration remained after injection which could not be annealed further. An equation was developed for the annealing rate of the major defect, H4, as a function of injection level, carrier concentration, and temperature.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.348856
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  • 6
    Electronic Resource
    Electronic Resource
    Detailed defect study in proton irradiated InP/Si solar cells (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 3584-3589 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A detailed study of the effects of proton irradiation-induced defects in heteroepitaxially grown InP/Si solar cells has been made through a combination of cathodoluminescence (CL), electron beam induced current (EBIC), and electrochemical capacitance versus voltage (ECV) carrier profiling measurements. The CL data indicate the distribution of nonradiative recombination centers both before and after proton irradiation, and temperature dependent and spectroscopic analysis of the CL signal give an estimate of the energies of the dominant defect levels. The EBIC data yield an estimate of the magnitude and spatial variation of the minority carrier diffusion length (L) in the base region. Values of L determined from EBIC measurements made on solar cells irradiated by protons ranging in energy from 0.1 up to 4.5 MeV follow a single curve when plotted versus displacement dose, Dd, allowing a single proton damage coefficient to be determined. The ECV measurements show the evolution of the carrier concentration profile in the cell under irradiation, as carrier removal first depletes and eventually type converts the base region. From an in-depth analysis of the combined data, the physical defects that give rise the radiation-induced energy levels are suggested, and a detailed understanding of the physical mechanisms causing the radiation response of InP/Si solar cells is developed. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371262
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  • 7
    Electronic Resource
    Electronic Resource
    A FRAMEWORK FOR REGIONAL ACCOUNTS: AN AUSTRALIAN PERSPECTIVE (1987)
    Oxford, UK : Blackwell Publishing Ltd
    Review of income and wealth 33 (1987), S. 0 
    Details
    ISSN: 1475-4991
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Economics
    Notes: The Australian Bureau of Statistics (ABS) has recently published a set of experimental estimates of gross State product at factor cost and its income components for the States of Australia (1): The regular compilation and publication of the estimates is also commencing. In compiling the estimates, certain conceptual issues were confronted. Others were recognized but have not required final resolution as yet because they are beyond the scope of the estimates presently compiled.This paper considers the development of a framework for regional accounts for countries with regional characteristics broadly similar to those of the Australian States by starting with the SNA framework that applies at the national Ievel. The difficulties that arise are highlighted and alternative approaches for dealing with specific issues discussed. These alternative approaches can have a significant impact on measured State relativities and performance over time. In some instances the choice between approaches may be narrowed because of practical considerations in the same way that the SNA is a conceptual framework that nevertheless has to take account of practicalities. The issues largely involve consideration as to whether or not to regard certain activities as extra-territorial in nature. If an extra-territorial concept is not adopted choices must be made on how to allocate data items related to such activities by State.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1475-4991.1987.tb00682.x
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  • 8
    Electronic Resource
    Electronic Resource
    THE EFFECT OF ‘WINTER BURN’ ON THE CHEMICAL COMPOSITION AND IN VITRO DRY-MATTER DIGESTIBILITY OF EIGHT GRASSES (1964)
    Oxford, UK : Blackwell Publishing Ltd
    Grass and forage science 19 (1964), S. 0 
    Details
    ISSN: 1365-2494
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-2494.1964.tb01144.x
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  • 9
    Electronic Resource
    Electronic Resource
    ADVANCE NOTES ON RESEARCH (1961)
    Oxford, UK : Blackwell Publishing Ltd
    Grass and forage science 16 (1961), S. 0 
    Details
    ISSN: 1365-2494
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-2494.1961.tb00252.x
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  • 10
    Electronic Resource
    Electronic Resource
    Annealing of irradiated epitaxial InP solar cells (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 4315-4321 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The annealing behavior of electron, proton, and alpha particle irradiated, epitaxial n+p InP solar cells has been characterized using several techniques. Current–voltage measurements were made under simulated 1 sun, AM0 solar illumination and in the dark. The radiation-induced defect spectra were monitored using deep level transient spectroscopy and the base carrier concentration profiles were determined through capacitance–voltage measurements. The irradiated cells were annealed at temperatures ranging from 300 up to 500 K. Some cells were annealed while under illumination at short circuit while others were annealed in the dark. These experiments produced essentially the same results independent of illumination and independent of the irradiating particle. An annealing stage was observed between 400 and 500 K, in which the radiation-induced defects labeled H3 and H4 were removed and the carrier concentration recovered slightly. Concurrently there was a small reduction in the junction recombination current and a slight increase in the photovoltaic (PV) output of the cell; however, most of the radiation-induced defects did not anneal, and the overall PV recovery was very small. A full analysis of the annealing data is given, and a model for the radiation response and annealing behavior of the cells is presented. The results are compared to those reported previously for irradiated, diffused junction InP solar cells. Although the radiation-induced degradation mechanisms appear to be essentially the same in the two cell types, the recovery of the PV output is found to be quite different. This difference in cell recovery is explained in terms of the defect annealing characteristics in the individual cell types. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363380
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