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  • 1
    Electronic Resource
    Electronic Resource
    Laser-induced surface-plasmon desorption of dye molecules from aluminum films (1992)
    s.l. : American Chemical Society
    Analytical chemistry 64 (1992), S. 476-478 
    Details
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ac00029a005
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  • 2
    Electronic Resource
    Electronic Resource
    High-efficiency soft x-ray emission spectrometer for use with synchrotron radiation excitation (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 2680-2690 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new soft x-ray spectrometer designed for use with photon excitation from synchrotron light sources is described and characterized. Special design features, including a close-spaced input slit, large toroidal gratings, and a two-dimensional charge-coupled-device array based detector system, provide exceptional measuring efficiency in a 5-m Rowland circle design. Descriptions are given of the spectrometer's mechanical and detector design, and of calibration and alignment procedures. The beam line providing photon excitation from a synchrotron light source is described. Typical electron beam and/or photon excited emission spectra of Al, Si, and LiF are presented and compared with those produced by other instruments.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139078
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  • 3
    Electronic Resource
    Electronic Resource
    Experimental study of the surface photoelectric effect in cesiated thin silver films (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 4580-4584 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the photoyield Y of thin silver films as a function of the angle of incidence for polarized light in the attenuated total reflection geometry. For s polarization a pure volume effect can explain the variation of the yield Ys. For p polarization the experimental photoyield Yp is much larger than that calculated by the volume process. The excess yield is attributed to the surface effect and a parameter K/p0 accounting for the structures observed in Yp has been calculated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341261
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  • 4
    Electronic Resource
    Electronic Resource
    New differential Bottcher-Onsager method used to determine polarizability and apparent radius of tungstosilicate (SiO4(WO3)124-) (1977)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 81 (1977), S. 696-703 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100523a003
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  • 5
    Electronic Resource
    Electronic Resource
    Optical properties of epitaxial CoSi2/Si and CoSi2 particles in Si from 0.062 to 2.76 eV (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 5601-5605 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the optical properties of epitaxial CoSi2 films on Si from 0.062 to 2.76 eV by ellipsometry and spectrophotometry. The energy dependencies of the dielectric constants show Drude behavior at energies lower than ∼0.2 eV with Drude parameters (h-dash-bar)ωp=(5.8±0.2) eV and (h-dash-bar)/τ=(0.09±0.02) eV. Using the measured optical constants, the CoSi2 film is shown to have maximum absorptance at a thickness of ∼20 nm for λ(approximately-greater-than)1.4 μm. Finally, we have calculated the absorptance of a composite film of CoSi2 particles embedded in Si and found that the absorptance peak due to a surface plasmon resonance in the CoSi2 particles shifts to higher energy as the ellipsoidal particles become more elongated, in agreement with recent observations by Fathauer et al. [Phys. Rev. B 44, 1345 (1991)].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350539
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  • 6
    Electronic Resource
    Electronic Resource
    Optical response of liquid mercury (1991)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 4790-4795 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: In many of the results of previous investigations, systematic differences have been observed in the directly measured reflectances of liquid Hg and those calculated from the optical constants determined by ellipsometry. We have performed a comprehensive set of experiments on liquid Hg at room temperature in order to resolve the problem of whether these discrepancies are real. A summary of some of our results have been published [Phys. Rev. B 40, 11994 (1989)]. Here we present a more detailed account of the experimental details and some new results. The spectral range of these experiments was confined to the visible spectral region. Normal-incidence reflectances of liquid Hg under vacuum and in contact with dielectric overlayers were measured. Reflectances of polarized light were measured at a photon angle of incidence of 70° for liquid Hg under vacuum. The optical constants of liquid Hg in contact with various dielectric overlayers were determined by ellipsometry and also by measuring reflectances as a function of angle of photon incidence at a MgF2–Hg interface. The results of the direct reflectance measurements were consistent with the optical properties determined by ellipsometry. No evidence was found for transition layers on the surface of liquid Hg.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.461722
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  • 7
    Electronic Resource
    Electronic Resource
    Optical absorption in a thin nickel wire (1986)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 292-293 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Absorption of a 633-nm photon in a cylindrical nickel wire with diameter 13 μm was measured by a photoacoustic method as a function of angle of photon incidence θ. A good photoacoustic signal was obtained with a 6-mW He-Ne laser as a light source without employing focusing optics. The absorption measured for p-polarized photons was found to be in good agreement with geometrical optics calculation. For s-polarized light, however, significant excess absorption was found for θ〉35°.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.336833
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  • 8
    Electronic Resource
    Electronic Resource
    Optical and electronic properties of the electron beam resist poly(butene-1-sulfone) (1985)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 4360-4364 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The optical properties of thin films of poly(butene-1-sulfone), PBS, an electron beam resist, are presented for the range of photon energies from 2.5 to 39.0 eV. The density of these films is found to be (1.39 ± 0.02) g cm−3. A sum-rule calculation is used to demonstrate the overall consistency of the data obtained. The optical data are used to calculate inelastic electron mean-free paths in PBS as a function of incident electron energy from 100 to 10 000 eV.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.335525
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  • 9
    Electronic Resource
    Electronic Resource
    Dispersion of surface plasmons in dielectric-metal coatings on concave diffraction gratings (1970)
    Springer
    The European physical journal 235 (1970), S. 97-109 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Anomalies in the intensity ofp-polarized light from concave diffraction gratings (Wood's anomalies) have been used to obtain surface plasmon dispersion curves for dielectric-metal layers on the grating surface. These include a 350 Å MgF2 layer and Al2O3 layers varying from a few angstroms to over 800 Å on an Al substrate. The wavelength range of the incident and diffracted light is from the visible to the vacuum ultraviolet (7,500−500 Å). Anomalous polarization peaks for Al2O3 layers in the vacuum ultraviolet (at ∼ 1,600 Å) are shown to shift significantly to longer wavelengths for only a few angstroms (up to 50 Å) of oxide thickness, while for thicknesses greater than ∼ 50 Å any further shift is small. In the visible region (〉 4,000 Å), on the other hand, the wavelength shifts are small for dielectric thicknesses up to ∼ 50 Å, but are large for thicknesses of several hundred angstroms. These results are in substantial agreement with the theoretical dispersion curves for these cases. Also considered are some of the effects of diffusion pump oil.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01395160
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  • 10
    Electronic Resource
    Electronic Resource
    Observed radiation from surface plasmons in aluminum (1970)
    Springer
    The European physical journal 239 (1970), S. 337-342 
    Details
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Plasma radiation from thin films of aluminum bombarded by non-normally incident 80 keV electrons has been investigated. Radiative decay of both volume plasmons and surface plasmons was observed with the surface plasmon radiation being very sensitive to contamination of the film surface by an oxide layer. The surface resonance occurs at 10.2 eV, whereas the volume resonance is at 15 eV. These values are in accord with electron energy-loss experiments.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01398244
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