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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 64 (1992), S. 476-478 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 81 (1977), S. 696-703 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 5601-5605 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the optical properties of epitaxial CoSi2 films on Si from 0.062 to 2.76 eV by ellipsometry and spectrophotometry. The energy dependencies of the dielectric constants show Drude behavior at energies lower than ∼0.2 eV with Drude parameters (h-dash-bar)ωp=(5.8±0.2) eV and (h-dash-bar)/τ=(0.09±0.02) eV. Using the measured optical constants, the CoSi2 film is shown to have maximum absorptance at a thickness of ∼20 nm for λ(approximately-greater-than)1.4 μm. Finally, we have calculated the absorptance of a composite film of CoSi2 particles embedded in Si and found that the absorptance peak due to a surface plasmon resonance in the CoSi2 particles shifts to higher energy as the ellipsoidal particles become more elongated, in agreement with recent observations by Fathauer et al. [Phys. Rev. B 44, 1345 (1991)].
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 4790-4795 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: In many of the results of previous investigations, systematic differences have been observed in the directly measured reflectances of liquid Hg and those calculated from the optical constants determined by ellipsometry. We have performed a comprehensive set of experiments on liquid Hg at room temperature in order to resolve the problem of whether these discrepancies are real. A summary of some of our results have been published [Phys. Rev. B 40, 11994 (1989)]. Here we present a more detailed account of the experimental details and some new results. The spectral range of these experiments was confined to the visible spectral region. Normal-incidence reflectances of liquid Hg under vacuum and in contact with dielectric overlayers were measured. Reflectances of polarized light were measured at a photon angle of incidence of 70° for liquid Hg under vacuum. The optical constants of liquid Hg in contact with various dielectric overlayers were determined by ellipsometry and also by measuring reflectances as a function of angle of photon incidence at a MgF2–Hg interface. The results of the direct reflectance measurements were consistent with the optical properties determined by ellipsometry. No evidence was found for transition layers on the surface of liquid Hg.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 4580-4584 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the photoyield Y of thin silver films as a function of the angle of incidence for polarized light in the attenuated total reflection geometry. For s polarization a pure volume effect can explain the variation of the yield Ys. For p polarization the experimental photoyield Yp is much larger than that calculated by the volume process. The excess yield is attributed to the surface effect and a parameter K/p0 accounting for the structures observed in Yp has been calculated.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 292-293 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Absorption of a 633-nm photon in a cylindrical nickel wire with diameter 13 μm was measured by a photoacoustic method as a function of angle of photon incidence θ. A good photoacoustic signal was obtained with a 6-mW He-Ne laser as a light source without employing focusing optics. The absorption measured for p-polarized photons was found to be in good agreement with geometrical optics calculation. For s-polarized light, however, significant excess absorption was found for θ〉35°.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 4360-4364 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The optical properties of thin films of poly(butene-1-sulfone), PBS, an electron beam resist, are presented for the range of photon energies from 2.5 to 39.0 eV. The density of these films is found to be (1.39 ± 0.02) g cm−3. A sum-rule calculation is used to demonstrate the overall consistency of the data obtained. The optical data are used to calculate inelastic electron mean-free paths in PBS as a function of incident electron energy from 100 to 10 000 eV.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 2680-2690 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new soft x-ray spectrometer designed for use with photon excitation from synchrotron light sources is described and characterized. Special design features, including a close-spaced input slit, large toroidal gratings, and a two-dimensional charge-coupled-device array based detector system, provide exceptional measuring efficiency in a 5-m Rowland circle design. Descriptions are given of the spectrometer's mechanical and detector design, and of calibration and alignment procedures. The beam line providing photon excitation from a synchrotron light source is described. Typical electron beam and/or photon excited emission spectra of Al, Si, and LiF are presented and compared with those produced by other instruments.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Astrophysics and space science 124 (1986), S. 377-388 
    ISSN: 1572-946X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The microorganism model of interstellar grains is investigated by spectroscopy from the infrared (IR), visible to the ultraviolet (UV) wave regions.E. coli, yeast and spores ofBacillus subtilis exhibit absorption bands at λ=3.1 and 9.7 μm; they also exhibit several absorptions at 6∼8 μm which are in agreement with the observed IS extinction curves. To obtain the extinction curves in the visible and UV regions, dry films of microorganism are prepared on a MgF2 plate or synthesized quartz plate and their spectra measured. In the wavelength region 190∼400 nm, conventional spectrophotometers are adopted for the measurement. The extinction curve of the film ofE. coli is similar to the observed IS curve. For the wave-range 100〈λ〈400 nm, a vacuum UV spectrometer is adopted to avoid absorptions due to O2 in the atmosphere. The extinction spectra by this method are in agreement with the result obtained by the conventional method where comparison is possible. The extinction curves ofE. coli and yeast are such that they incrase towards the short wavelength and exhibit a peak at λ-190 nm, which is different from the well-known IS peak at λ=220 nm. It remains to be seen whether interstellar low temperatures (10∼40 K) can shift the peak position in the extinction curve of biochemical materials.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 251 (1972), S. 271-288 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The x-ray satellites found on the high energy sides of theL 2,3 emission bands of Na, Mg, Al, and Si have previously been attributed to the radiative decay of double ionization states. However, in some recent papers it has been proposed that the satellites in Al and Si may arise from the simultaneous radiative decay of a core ionization state and a volume plasmon. A detailed investigation of the high energy satellites of theL 2,3 x-ray emission bands of Na, Mg, Al, and Si have been made for incident electron energies from 500 eV to 5 keV and the results compared with the double ionization theory. Plasmon involvement is also considered. The present results lend additional support to the first interpretation; namely, that the satellites arise from the radiative decay of atoms with a double vacancy in theL 2,3 (2p) shell and not from the plasma phenomenon.
    Type of Medium: Electronic Resource
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