ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A streaked multiple pinhole camera technique, first used by P. Choi and co-workers [C. Deeney and P. Choi, Rev. Sci. Instrum. 60, 3558 (1989); P. Choi and R. Aliaga, ibid. 61, 2747 (1990)] to record time- and two-dimensional space-resolved soft x-ray images of plasma pinches, has been implemented on laser plasmas at NOVA. The instrument is particularly useful for time-resolved imaging of small sources (〈150 μm in size) such as implosions for which the necessary alignment accuracy is relaxed from ≤10 μm for a single pinhole, to 200 μm for a nine-pinhole column. Results at 20 μm, 30-ps resolution are presented for (approximately-greater-than)2.5-keV imaging, complementing the existing 1–3-keV streaked x-ray microscope capabilities at NOVA.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143496
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