Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
85 (1999), S. 1689-1692
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The magnetization reversal processes and magnetoresistance behavior in micron-sized Ni80Fe20 wires with periodically modulated width have been studied. The wires were fabricated by electron beam lithography and a lift-off process. A combination of the magneto-optical Kerr effect and magnetoresistance measurements shows that the lateral shape of the wires greatly influences the magnetic and transport properties. For the field applied along the wire axis, the hysteresis loops are strongly influenced by the wire shapes. In contrast to the fixed width wires, the modulated width wires show an additional transverse magnetoresistance, which has been attributed to the shape-dependent demagnetizing fields and the inhomogeneous current density. The resistance of the modulated width wires is dominated by the contribution due to the narrow part of the wires; however, the inhomogeneous current density in the wide part of the wires contributes a significant transverse magnetoresistance. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.369307
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