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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Environmental science & technology 26 (1992), S. 1005-1013 
    ISSN: 1520-5851
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4727-4729 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The domain configuration in permalloy wires (30 nm thick, 10 μm wide, and 205 μm long) with a wide size range of a narrow central bridge (5 μm long and w μm wide; 0.5≤w≤10 μm) were investigated in both their demagnetized and remanent states using magnetic force microscopy and the results were confirmed by micromagnetic calculations. At the bridge region, domain walls were found to be shifted by a small external field. Scanning magneto-optical Kerr effect revealed that the coercivity in these structures are the same as that in a straight wire, suggesting that domain wall movement is the dominant process in the magnetization reversal of these structures. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 6178-6180 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetoresistance (MR) and domain structure of submicron NiFe wires and crosses fabricated using advanced electron beam lithography techniques have been studied in order to investigate the dependence of MR on the detailed domain configurations. While the 0.5 μm wire shows almost no longitudinal MR, the cross sample clearly shows a variation of the resistance upon sweeping the magnetic field, indicating an MR effect associated with the domain structures which form at the junction. By correlating the MR curves with the domain configurations obtained from magnetic force microscopy, we found that a 180° domain wall trapped in the junction of this 0.5 μm cross contributes a negative MR effect. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 3032-3036 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetization reversal process in permalloy (Ni80Fe20) wire junction structures has been investigated using magnetoresistance (MR) measurements and scanning Kerr microscopy. A combination of electron beam lithography and a lift-off process has been utilized to fabricate wires consisting of two 200 μm length regions with distinct widths w1 and w2 in the range 1–5 μm. Longitudinal MR measurements and magneto-optic Kerr effect hysteresis loops demonstrate that the magnetization reversal of the complete structure is predominantly determined by the wider region for fields applied parallel to the wire axis. Magnetic force microscopy and micromagnetic calculations show that several domain walls nucleate in the wider part and are trapped in the junction area. This implies that domain nucleation at the junction of the wire initiates magnetization reversal in the narrow half. As a consequence, the switching fields are found to be identical in both halves in this case. These results suggest the possibility of designing structures which can be used to "launch" reverse domains in narrow wires within a controlled field range. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 1689-1692 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetization reversal processes and magnetoresistance behavior in micron-sized Ni80Fe20 wires with periodically modulated width have been studied. The wires were fabricated by electron beam lithography and a lift-off process. A combination of the magneto-optical Kerr effect and magnetoresistance measurements shows that the lateral shape of the wires greatly influences the magnetic and transport properties. For the field applied along the wire axis, the hysteresis loops are strongly influenced by the wire shapes. In contrast to the fixed width wires, the modulated width wires show an additional transverse magnetoresistance, which has been attributed to the shape-dependent demagnetizing fields and the inhomogeneous current density. The resistance of the modulated width wires is dominated by the contribution due to the narrow part of the wires; however, the inhomogeneous current density in the wide part of the wires contributes a significant transverse magnetoresistance. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 1609-1611 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The scaling of the magnetic hysteresis loop area of permalloy disks (20–400 μm diam) has been studied as a function of applied field amplitude H0 and frequency Ω using scanning Kerr microscopy. An increase in the dynamic coercivity with reduced size is observed for d〈100 μm in the frequency range studied (0.1–800 Hz). However, the loop area A follows the scaling relation A∝H0αΩβ, with α(approximate)0.14 and β(approximate)0.50 throughout the entire size range studied. Our results demonstrate that the dynamic scaling behavior is universal even though the lateral size influences the domain structure and magnetic reversal behavior. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1572-9567
    Keywords: emissometer ; directional emissivity ; directional total emissivity ; thermal radiation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A novel device for measurements of the normal and directional total emissivity of solid surfaces in the range 300–600 K is described. The measurements were performed using the radiation comparison method. A novel black-body radiation source is used as a standard. The detection system consists of a pyroelectric head, a preamplifier, a chopper, and a matching lock-in amplifier with analog recorder ourput. The device is simple and well suited for routine measurements. Comparison of our results with those of previous investigations shows a good agreement.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Chromatographia 23 (1987), S. 370-372 
    ISSN: 1612-1112
    Keywords: Graphite fluoride ; Trace analysis ; Environmental samples
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Summary Graphite fluoride has been evaluated as an adsorbent for use in concentrating organic impurities in air and water samples. This material has been shown to yield large breakthrough volumes for most organics and should be useful for trace analysis in environmental chemistry.
    Type of Medium: Electronic Resource
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