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  • 1
    ISSN: 1432-0630
    Keywords: 78.20 ; 78.65
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The electrical and geometric properties of GaAs multilayer structures are measured nondestructively by infrared reflectance spectroscopy (50–5000 cm−1). Using oblique incidence and both s- and p-polarizations of the probing beam, carrier concentration and thickness of the epitactic films as well as the carrier concentration of the GaAs substrate are determined. The main structures in the spectra are due to phonon reststrahlen bands, Fabry-Perot interferences and the zeros of the dielectric function leading to dips in the reflectance (Berreman Mode). The results compare favorably with a depth-resolved secondary ion mass spectrometric (SIMS) sample analysis. The range of applicability of the method is discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester : Wiley-Blackwell
    Organic Magnetic Resonance 29 (1991), S. 137-142 
    ISSN: 0749-1581
    Keywords: 20(R,S)-Hydroxy-23-norcholanoic acid derivatives ; 1H NMR ; Pyridine-induced shifts ; Molecular mechanics calculations ; Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: Proton chemical shifts for the C-18, C-21, —CO2CH2CH3 and —CO2CH2CH3 protons of epimeric ethyl esters of 20(R,S)-hydroxy-23-norcholanoic acids were measured in deuteriochloroform and pyridine-d5. The observed solvent shifts due to specific OH - pyridine hydrogen-bonded complexes allowed the quantification of the epimeric mixtures by analysis of the pyridine-d5 1H NMR spectra. The main features of the pyridine-induced shifts are rationalized in terms of the preferred conformations for the 20R- and 20S-epimers, which are predicted by molecular mechanics calculations.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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