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  • Chemistry  (12)
  • Sklerosing therapy  (2)
  • 36.40.01  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    European journal of pediatrics 155 (1996), S. 649-652 
    ISSN: 1432-1076
    Keywords: Key words Lymphangioma ; Sklerosing therapy ; OK-432
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract Between April 1988 and July 1995, 11 children with a lymphangioma were treated with intralesional OK-432 injection. In 7 patients it was the primary therapy and total shrinkage of the lesion was obtained in 5 of them. Two patients did not respond and the children underwent surgery. Following incomplete surgical removal or recurrence of the lymphangioma, intralesional OK-432 injection was used as secondary therapy in 4 patients. Total regression was observed in 2 cases and marked regression in the 2 others. No serious side-effects except fever lasting for 2–3 days and slight tenderness with swelling of the lymphangioma for 3–4 days after the injection was noted. Local inflammatory reaction did not cause any damage to the overlying skin and did not lead to scar formation. Depending on the size, location, and anatomical relationship to the airway, intralesional injections of the lymphangiomas were performed under general anaesthesia and the children were observed for 24 h. There was no recurrence after follow up periods ranging from 2 months to 7 years. Conclusion Intralesional injection of OK-432 represents an alternative, safe and effective treatment for lymphangiomas. It can be used as the primary therapy, after partial surgical excision, or in recurrent lymphangiomas.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    European journal of pediatrics 155 (1996), S. 649-652 
    ISSN: 1432-1076
    Keywords: Lymphangioma ; Sklerosing therapy ; OK-432
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract Between April 1988 and July 1995, 11 children with a lymphangioma were treated with intralesional OK-432 injection. In 7 patients it was the primary therapy and total shrinkage of the lesion was obtained in 5 of them. Two patients did not respond and the children underwent surgery. Following incomplete surgical removal or recurrence of the lymphangioma, intralesional OK-432 injection was used as secondary therapy in 4 patients. Total regression was observed in 2 cases and marked regression in the 2 others. No serious side-effects except fever lasting for 2–3 days and slight tenderness with swelling of the lymphangioma for 3–4 days after the injection was noted. Local inflammatory reaction did not cause any damage to the overlying skin and did not lead to scar formation. Depending on the size, location, and anatomical relationship to the airway, intralesional injections of the lymphangiomas were performed under general anaesthesia and the children were observed for 24 h. There was no recurrence after follow up periods ranging from 2 months to 7 years.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1434-6079
    Keywords: 36.40.01 ; 33.80.Gj
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Optimized geometries and binding energies are calculated for ethene (ethylene) dimers, trimers, and tetramers based on a pairwise additive dimer potential. From these results intermolecular frequencies and relative abundancies (catchment areas) of the different isomers are obtained and compared with the results of accurate measurements of the photodissociation upon absorption of one photon of a CO2 laser in the region of thev 7 monomer absorption band at 949 cm−1. The clusters are size selected in a scattering experiment and show for a cluster size fromn=2 ton=6 a frequency maximum shifted by 3 cm−1 to the blue compared with the monomer. The result is explained by the predominance of chains and chain-like structures of the clusters in the photodissociation process. The chains consist of cross-like dimer sub-units.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 0863-1786
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: Die Oberflächenspannung des Quecksilbers im höchsten Vakuum liegt zwischen dem Anfangswert und dem Endwert der Oberflächenspannung in Luft. Bei Zinn konnte eine Veränderung der Oberflächenspannung mit der Zeit im Vakuum von 5·10-5 mm Hg nicht festgestellt werden. Thallium wies eine Zunahme der Oberflächenspannung mit der Zeit im Vakuum von 10-5 bis 10-4 mm Hg auf. Aus diesen Feststellungen wurde geschlossen, daß dort, wo beim Quecksilber Veränderungen der Oberflächenspannung mit der Zeit vorliegen, die sich einstellenden Oberflächenspannungen sich als Resultierende zwischen den Einflüssen der Anordnung der Metallatome der Oberfläche und der ein- und angelagerten Gasatome ergeben.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 0863-1786
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Chemie Ingenieur Technik - CIT 68 (1996), S. 1158-1158 
    ISSN: 0009-286X
    Keywords: Chemistry ; Industrial Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Chemie Ingenieur Technik - CIT 70 (1998), S. 1205-1206 
    ISSN: 0009-286X
    Keywords: Chemistry ; Industrial Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 0009-286X
    Keywords: Fischer-Tropsch-Synthese ; Suspensions-Reaktor ; Mn/Fe- und Fe/Cu-Katalysator ; Produktverteilung nach Schulz-Flory ; Geschwindigkeitskonstanten für Synthesegas-Verbrauch ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 511-516 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Vapor phase decomposition-droplet surface etching-graphite furnace atomic absorption spectroscopy (VPD-DSE-GFAAS) is discussed as a technique for the determination of low levels of metals in chemical oxides on silicon surfaces. The VPD-DSE-GFAAS technique was found to be statistically equivalent to results obtained by the standard surface techniques of total reflectance x-ray fluorescence spectroscopy (TXRF) and SIMS. The capability of the VPD-DSE-GFAAS technique has been extended to detection limits in the 107 to low 109 atom cm-2 range. A positive linear relationship was found for iron, calcium, zinc and aluminum deposited on a silicon wafer from an ammonium hydroxide-hydrogen peroxide-water (SC1) solution. Sodium and potassium deposition from SC1 solutions was found to be independent of solution concentrations. Deposition for these metals appeared to be primarily related to localized micron-sized nuclei deposits and not to adsorption on an atomic scale.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 359-366 
    ISSN: 0142-2421
    Keywords: X-ray technique for structure analysis ; depth profiling ; nanocluster ; self-diffusion in metals ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Results obtained from scanning transmission electron microscopy combined with energy-dispersive X-ray imaging (EDX) and from Rutherford backscattering spectroscopy (RBS) of implanted and multilayered structures are compared in order to demonstrate the depth profiling capabilities of both analysis methods, especially at interfaces. Typical samples for dilute and concentrated systems are compared. The dilute system is represented by Ge nano-clusters in an amorphous SiO2 matrix on a Si substrate produced by ion implantation and subsequent annealing. The concentrated system of alternating Ag-Al multilayers (typical thickness ∽200 nm) is produced by evaporation on Si substrates under high vacuum conditions. A significant advantage of STEM-EDX is the two-dimensional mapping and depth profiling of light and heavier elements in heavy-Z substrates (depth scale in nanometres) without the lack of a deteriorating depth resolution at increasing depth, as happens in RBS. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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