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  • 1
    ISSN: 1432-2242
    Keywords: Wheat ; Haynaldia villosa ; Alien translocation ; Powdery mildew resistance ; In situ hybridization
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Several Triticum aestivum L.-Haynaldia villosa disomic 6VS/6AL translocation lines with powdery mildew resistance were developed from the hybridization between common wheat cultivar Yangmai 5 and alien substitution line 6V(6A). Mitotic and meiotic C-banding analysis, aneuploid analysis with double ditelosomic stocks, in situ hybridization, as well as the phenotypic assessment of powdery mildew resistance, were used to characterize these lines. The same translocated chromosome, with breakpoints near the centromere, appears to be present in all the lines, despite variation among the lines in their morphology and agronomic characteristics. The resistance gene, conferred by H. villosa and designated as Pm21, is a new and promising source of powdery mildew resistance in wheat breeding.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    International journal of thermophysics 20 (1999), S. 743-753 
    ISSN: 1572-9567
    Keywords: CCD ; contactless ; dilatometer ; foil ; thermal expansion
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A contactless, compact, low-cost dilatometer based on a laser-pulse thermal-conductivity apparatus has been developed to measure the linear thermal expansion of foil materials. The two sample-edge images are projected onto the array of a charge-coupled device (CCD). Changes in sample length are determined from measurements of the corresponding displacements of the sample-edge images focused on the CCD. The dilalometer performance was tested by comparing results of measurements of the thermal expansion for pure copper with published data. The linear thermal expansion of an L-16-type foil of 20-μm thickness, which is a candidate material for thermocontrol layers (in engineering), was measured with the apparatus.
    Type of Medium: Electronic Resource
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