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  • 11
    ISSN: 0003-9861
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Atomic Data and Nuclear Data Tables 31 (1984), S. 1-80 
    ISSN: 0092-640X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Energy, Environment Protection, Nuclear Power Engineering , Physics
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3439-3444 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dynamic process of subsurface altered layer formation in a Cu-Pt alloy under Ar+ ion bombardment has been studied by sequential Auger electron spectroscopy (AES) and ion scattering spectroscopy (ISS) measurements. For this study, we recently developed a compact coevaporator, which enables Cu and Pt to be deposited at a constant composition ratio (within ±3 at. %) onto a Si substrate cooled to liquid-nitrogen temperature. The average surface composition of the alloy film was monitored by AES throughout the deposition procedure, and the composition of the topmost atomic layer was measured by ISS right after the end of the film deposition. The data show that the topmost atomic layer was considerably Cu-rich while subsurface atomic layers were of constant composition. During Ar+ ion bombardment, however, the surface composition of Cu, measured by sequential AES and ISS, gradually decreased with time toward a steady-state value. The temporal evolution of the composition profile is described. The surface-segregation constant and radiation-enhanced diffusion coefficient for the Cu-Pt alloy under Ar+ ion bombardment are inferred from the measured composition profile. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 14
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7180-7187 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Monte Carlo simulation code has been developed to describe the x-ray generation in a specimen for electron probe microanalysis (EPMA), enabling x-ray spectra observed by EPMA to be reproduced theoretically. The Monte Carlo simulation is based on the use of the Mott cross section and Bethe stopping power equation in describing elastic and inelastic scattering processes, respectively. With respect to x-ray generation the Sommerfeld theory for bremsstrahlung radiation was described by equations of Kirkpatrick–Wiedmann and of Statham for bremsstrahlung cross section. The up-to-date compilation of mass absorption coefficient by Henke, Gullikson, and Davis [At. Data Nucl. Data Tables 54, 181 (1993)] is used to evaluate attenuation of x-ray intensity. To verify the present Monte Carlo simulation measurements of x-ray spectra for Cu and Rh targets have been performed for primary electron energies of 10–30 keV by energy-dispersive x-ray spectrometry of an electron probe microanalyzer. Excellent agreement between experimental spectra and calculated results has been confirmed in the cases investigated, leading to the conclusion that the Monte Carlo simulation technique will be a powerful tool for more comprehensive understanding of x-ray generation in EPMA specimens. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 15
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 1187-1195 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Monte Carlo simulations of cascade processes of secondary electron generation in Si, Cu, and Au have been performed to study the energy distribution of backscattered electrons in the low-energy region. Calculation results show that the characteristic hump appearing in the energy distribution above Si-LVV Auger peak in the EN(E) spectrum can be well described by those electrons ejected from the L shell followed by the cascade process. The shape of EN(E) spectra in the low-energy region is dominated by the directly produced secondary electrons and, hence, strongly correlated with the excitation spectrum Im[−1/ε(ω)] for electron generation.
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 1811-1816 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Detailed operations of the apparatus for the stroboscopic observation of periodic phenomena at the region of line frequencies, such as the magnetic domain response, under the scanning electron microscopy are described in this paper. To achieve the stroboscopic observation at such low frequencies, a new line-sampling technique has been introduced instead of the conventional point-sampling method. In addition to the line-sampling stroboscopy, a multiframe operation is also introduced to display the stroboscopic images of different phase values simultaneously. These operations are simply realized by applying the raster separation and the blanking on the display monitor scope under the multiple line-sampling during the one-drive period. To demonstrate the ability of this simple apparatus, some results of the stroboscopic observation of magnetic domains in an Fe–Si sample under a 60-Hz drive field are also presented in this paper.
    Type of Medium: Electronic Resource
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  • 17
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 3647-3648 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An evaporation source of simple and compact construction was devised. This source is 20 mm in diameter and 30 mm long; is composed of a ring filament, control aperture, and disk-shaped sample (source) and shield cover; and enables the evaporation of source material to be easily controlled at a constant rate without the use of a feedback system. This evaporation source ensures depositions at constant rates for several hours. Refractory metal films of several thousand angstroms thickness can be deposited onto substrates held 10 cm from the source. Typical performance characteristics in the application to Ti films are presented.
    Type of Medium: Electronic Resource
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  • 18
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new method for pattern reduction in the x-ray region is proposed. In its principle was used the asymmetric Bragg reflection giving the different beamwidth in the reflected beam from the incident one. Light from an undulator line (BL-2) at the Photon Factory was used to obtain highly spatially resolved replication in reasonably short exposure time. Performed was one-dimensional demagnification of a pattern with a ratio of 1/4 in the following condition: Si 111 reflection was used where the offset angle α from the surface is 22° and the wavelength λ was 3.5 λ, which is available from the 7th harmonic of the undulator radiation. The submicron scale resist pattern was resolved.
    Type of Medium: Electronic Resource
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  • 19
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 4231-4237 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Effective energy-loss functions were derived for oxygen-adsorbed amorphous silicon surfaces from a reflection electron energy-loss spectroscopy analysis based on the extended Landau theory. This study has revealed that the intensity of the surface-plasmon-loss peak for a clean surface decreases and its peak position shifts towards the lower-energy losses as oxygen exposure proceeds (≤1000 L). To understand the above behavior of the surface-plasmon-loss peak, the distribution of the energy losses was calculated using the hydrodynamic model. The decrease and shift of the surface-plasmon-loss peak has been described with considerable success by assuming that the quasifree static electron density in the vicinity of the silicon surface decreases as oxygen adsorption proceeds owing to oxygen's high electron affinity. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 20
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 3559-3561 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The temperature dependence of the coercivity (HcI)of Nd15(Fe1−xCox)77B8 and (Nd1−xDyx)15Fe77B8 sintered magnets and that of the saturation magnetization (Ms) and the anisotropy field (HA) of Nd2(Fe1−xCox)14B and (Nd1−xDyx)2Fe14B single crystals have been observed in the temperature range between 295 and 800 K. The dependence of the coercivity on the major magnetic properties of the matrix phase in the Nd-Fe-B based magnets are investigated using the μ0HA vs μ0HcI+Ms plot. It is demonstrated that this method of analysis is useful in studying the coercivity mechanism of the Nd-Fe-B based sintered magnets.
    Type of Medium: Electronic Resource
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