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Magnetic microstructure of amorphous alloys studied using scanning electron microscopy with polarization analysis (abstract) (1987)

Unguris, J. ; Hembree, G. G. ; Celotta, R. J. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 61 (1987), S. 3217-3217

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: The recent development of scanning electron microscopy with polarization analysis (SEMPA) has made the direct measurement of magnetic structures with submicron spatial resolution possible.1,2 Because the secondary electron spin polarization is proportional to the magnetization in the area probed by the incident electron beam, the magnetization is measured directly, independent of topographic contrast. Topographic images are measured simultaneously, however, permitting comparisons between magnetic and structural properties. In addition the use of multiple, orthogonal detectors permits measurement of the magnetization magnitude and direction. We have recently used this technique to look at various Fe-rich amorphous ferromagnetic alloys. In particular SEMPA was used to examine the rotation of the magnetization within domain walls and to study changes in magnetic microstructure due to Ar ion bombardment and annealing.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.338906

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Digitale Medien

Scanning electron microscopy with spin polarized electrons (invited) (abstract) (1987)

Unguris, J. ; Hembree, G. G. ; Celotta, R. J. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 61 (1987), S. 4307-4307

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: The recent joining of scanning electron microscopy and electron spin polarization analysis has greatly improved the ability to study magnetic microstructure.1,2 By measuring the spin polarization of secondary electrons, scanning electron microscopy with polarization analysis (SEMPA) can directly measure the magnitude and direction of the magnetization and direction of the magnetization in the region probed by the incident electron beam. This region is defined by the diameter of the incident electron beam (∼10 nm) and the escape depth of the secondaries (∼5 nm). In addition to the purely magnetic image SEMPA also simultaneously and independently measures the usual topographic image, thereby making comparisons between magnetic and topographic structures easier. We have successfully used SEMPA to study magnetic structures in Fe crystals, permalloy films, CoNi recording media, and metglasses. Examples from this work will be given in order to demonstrate the unique capabilities of SEMPA.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.338454

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Digitale Medien

Improved instrument for medium energy electron diffraction and microscopy of surfaces (1985)

Elibol, C. ; Ou, H.-J. ; Hembree, G. G. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 56 (1985), S. 1215-1219

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: The REMEDIE system for reflection electron microscopy and electron diffraction at intermediate energies (0.5–20 keV) has been rebuilt with an improved imaging resolution of better than 10 nm, a convenient and versatile system for observation diffraction patterns and provision for specimen preparation and treatment suitable for surface structural studies. The current capabilities of the instrument are illustrated by results obtained from cleaved and annealed silicon (111) surfaces with or without thin deposited silver and gold layers.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1137978

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