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  • 11
    Electronic Resource
    Electronic Resource
    Parallel forces induced by waves in ion cyclotron range of frequencies (1995)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 2 (1995), S. 1056-1062 
    Details
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new mechanism is identified for radio frequency (RF) wave induced force and current drive caused by a kinetic flux carried by coherent oscillations of plasma particles. The induced force along a magnetic field line by RF heating of plasmas is calculated with a one-dimensional slab model, and found to be contributed by the plasma power absorption and spatial inhomogeneity. The inhomogeneity term consists of a kinetic flux and a flux related to RF wave helicity injection rate. The effect from the kinetic flux exists only in a warm plasma, whereas, in contrast, the effect from the helicity related flux exists even in a cold plasma. The forces are calculated for both electrons and ions in the ion cyclotron range of frequencies (ICRF), and the effects from the ion cyclotron and the second harmonic resonance are included. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.871384
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  • 12
    Electronic Resource
    Electronic Resource
    Influence of imperfections on the dynamical response in model quantum cellular automata (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 6571-6576 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The time-dependent behavior of quantum cellular automata (QCA) with imperfections is examined. We have studied a chain of quantum cells with the imperfections introduced by (i) variations of intercellular distances, (ii) variations of intercell tunneling strengths, and (iii) stray charges. We find that imperfections like these may easily impair the switching properties of semiconductor based QCAs. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370163
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  • 13
    Electronic Resource
    Electronic Resource
    Hyper-Rayleigh scattering using 1907 nm laser excitation (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 1277-1284 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The experimental setup used to perform hyper-Rayleigh scattering at the near infrared wavelength of 1907 nm is described. The setup described is employed to measure the first molecular hyperpolarizabilities, β, of three new thiophene-based nonlinear optical chromophores. Although scattering at this wavelength is weak and the experiment requires great care, use of it allows one to obtain near dispersion-free first hyperpolarizability. Comparing the results with those obtained on the same chromophores using the 1064 nm excitation, we show that the two state model, which is commonly used to relate the β values at different wavelengths, fails to correlate the results at these two excitation wavelengths. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149586
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  • 14
    Electronic Resource
    Electronic Resource
    Experimental characterization of ALS undulator radiation : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1885-1888 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The radiation from the 5 cm period undulator at the Advanced Light Source (ALS) has been characterized using a transmission grating spectrometer. Spectral and angular distributions of radiation were measured for deflection parameter K values between 0.45 and 2.12 at low storage ring current (0.1–0.5 mA). From the calibration of the spectrometer, the absolute flux density of the undulator harmonics has been determined together with the spectral linewidth. The electron-beam emittance was determined by analyzing the angular distribution of the redshifted fundamental. Comparison has been made with radiation calculations based upon the measured magnetic-field data of the undulator. Including field errors, electron-beam emittance, and energy spread, good agreement is found between theoretically and experimentally determined harmonic widths and peak brightness. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145814
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  • 15
    Electronic Resource
    Electronic Resource
    One-dimensional position-sensitive superheated-liquid-droplet in-phantom neutron dosimeter (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5442-5449 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The one-dimensional (1D) position-sensitive superheated-liquid-droplet in-phantom neutron dosimeter incorporating a sensitive volume emulsion has been fabricated, prepared, and tested. The 1D position-sensitive superheated-liquid-droplet dosimeter (SLDD) is fabricated from a 3/8-in.-o.d., 1/4-in.-i.d., 20-cm-long, PlexiglasTM-walled tube filled with a mixture of superheated-liquid FreonTM droplets and host medium glycerol solution. Washer-shaped piezoelectric acoustic transducers are positioned at both ends of the tube; they determine the number and positions of the acoustic events when the superheated-liquid droplets evaporate upon neutron irradiation. The SLDD is sensitive to a wide range of neutron energy, from thermal (0.0253 eV) up to 10 MeV and higher. The SLDD is irradiated with the 137Cs and 60Co γ sources, as well as a 252Cf neutron source to test for its radiation response and spatial resolution. The SLDD based on the Freon-134a superheated-liquid droplets operating at 20 °C and 1 atm is found to be ideal for measuring neutron depth dose and relative biological effectiveness dose. This study also proves that the position of the radiation-induced nucleation acoustic events can be linearly determined from the differences in the transmission times received by the acoustic transducers on the 1D SLDD. The spatial resolution of the neutron depth dose is 1 mm due to the finite response time (1 μs) of the piezoelectric acoustic transducers. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146066
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  • 16
    Electronic Resource
    Electronic Resource
    Postgrowth annealing effects of TiO2 thin films grown on InP substrate at low-temperature by metal-organic chemical-vapor deposition (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4459-4461 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structural and electrical properties of titanium dioxide (TiO2) thin films grown on n-type InP(100) substrate by low-pressure metal-organic chemical-vapor deposition have been studied with postannealing. The thin films of TiO2 were deposited at a low temperature of 350 °C using titanium isopropoxide and oxygen. After a postgrowth annealing by the rapid thermal annealing method at a temperature of 850 °C for 15 s, the TiO2/InP structure of only the anatase phase with (101) and (200) peaks was observed by x-ray diffraction analysis. No interface reaction between TiO2 and InP was detected by Auger electron spectroscopy depth profiling. From capacitance–voltage measurement of the Al/TiO2/n-InP structure, the interface density of states at midgap energy and the dielectric constant were approximately low 1012 eV−1 cm−2 at midgap energy and about 50, respectively. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361757
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  • 17
    Electronic Resource
    Electronic Resource
    Magnetic properties of epitaxial and polycrystalline Fe/Si multilayers : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4772-4774 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Fe/Si multilayers with antiferromagnetic interlayer coupling have been grown via ion-beam sputtering on both glass and single-crystal substrates. High-angle x-ray diffraction measurements show that both sets of films have narrow Fe peaks, implying a large crystallite size and crystalline iron silicide spacer layers. Low-angle x-ray diffraction measurements show that films grown on glass have rougher interfaces than those grown on single-crystal substrates. The multilayers grown on glass have a larger remanent magnetization than the multilayers grown on single-crystal substrates. The observation of magnetocrystalline anisotropy in hysteresis loops and (hkl) peaks in x-ray diffraction demonstrates that the films grown on MgO and Ge are epitaxial. The smaller remanent magnetization in Fe/Si multilayers with better layering suggests that the remanence is not an intrinsic property. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361926
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  • 18
    Electronic Resource
    Electronic Resource
    Temperature dependence of microstructure and magnetic properties of Co/Ti multilayer thin films (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 7301-7305 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructural and magnetic properties of amorphous Co/Ti multilayer films and their variation with temperature are investigated by transmission electron microscopy (TEM) analysis and thermomagnetic measurements. Thermomagnetic curves showed two peaks at about 400 and 520 °C. The evolution of the structure monitored in the hot stage of the TEM was found to be consistent with the magnetic changes. The first peak of the saturation magnetization Ms at 400 °C was associated with the transformation from amorphous ferromagnetism to paramagnetism due to the amorphous Co existing in the film. Ms began to increase corresponding to the crystallization point of the ferromagnetic Co phase, which decreased with increasing amounts of Co in the film. Ms reached its maximum at 520 °C and then decreased because the phase transition occurred at a temperature greater than 520 °C and approached completion at 650 °C. The amorphous phase and crystalline phase formation and phase transition during annealing were observed in Co/Ti multilayer thin films and successfully explained the thermomagnetic properties of the film. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365328
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  • 19
    Electronic Resource
    Electronic Resource
    Thermal evolution of carbon in annealed Co/C soft x-ray multilayers (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 1428-1436 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structures of the carbon sublayers in the annealed Co/C soft x-ray multilayers fabricated using a dual-facing-target sputtering system have been characterized by x-ray diffraction (XRD), transmission electron microscopy (TEM), and Raman spectroscopy (RS). The results suggest that the structural variations in the carbon layers can be roughly divided into three stages, i.e. ordering, crystalline and grain growth stages. In the ordering stage with annealing temperatures below 400 °C, the upward shift of D and G lines in Raman spectra indicates that the amorphous carbon layers are changing from ones with bond-angle disorder and fourfold-bonding only to ones containing threefold-bonding. In the crystalline stage, the amorphous carbon layers in the as-deposited multilayers crystallize to graphite crystallites in the annealing temperature range of 500–600 °C. The rapid increase in the intensity ratio of D line to G line and dramatic decrease in linewidth further confirm this substantial structural change. In the grain growth stage, the specimens are annealed at temperatures higher than 700 °C. The decrease in the intensity ratio implies a growth in the graphite crystallite dimensions, which is consistent with the XRD and TEM results. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363010
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  • 20
    Electronic Resource
    Electronic Resource
    Hyperpolarizabilities of the m-substituent phenyl amine based chromophores determined from the hyper-Rayleigh scattering and two photon absorption induced fluorescence (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 5996-6001 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The technique of hyper-Rayleigh scattering is used to determine and compare the first hyperpolarizabilities (β) of five structurally similar m-substituent phenyl-amine based chromophores using both internal and external standards. Contribution from the two photon absorption induced fluorescence to the observed signal is carefully removed. The chromophores with the m-substituted phenyl ring, that stabilizes the maximal charge-transfer state through resonance effect, are found to have larger static β values and redshifted electronic absorption peaks (λmax) compared with the para-nitroaniline (pNA) chromophore. The electron-withdrawing m-substituent of the chromophore is found to have the effect of reducing both the β and λmax values. Its effect on β is less pronounced when the π-electron reservoir is large. The enhancement of β value and the redshift λmax are observed to be consistent with the extent of the π electron delocalization. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363597
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