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  • 1990-1994  (5)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of thermal analysis and calorimetry 38 (1992), S. 649-655 
    ISSN: 1572-8943
    Keywords: corrosion ; high temperature oxidation ; non-isothermal kinetics ; X-ray diffraction method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung Unter Anwendung eines Diffraktometers mit einer Hochtemperatureinheit wurde unterhalb 570°C mittels Röntgendiffraktion die Oxidation von Fe-ARMCO untersucht. Die Oxidationsprodukte wurden in situ bestimmt und das Differenzverfahren ergabY(T)-Kurven, die die globalen Änderungen zeigen. Diese Kurven wurden anhand der mikroskopisch bestimmten resultierenden Dicken der Oxidschicht kalibriert, wobei man die Funktionx(T) erhält. Dieser Kurve wurde eine berechnete, die Arrheniussche Beziehung enthaltende Funktion angepaßt, wodurch man die Aktivierungsenergie und die Oxidations Geschwindigkeitskonstante als Funktion der Temperatur erhält.
    Notes: Abstract Temperature resolved X-ray diffraction using a diffractometer equipped with a high temperature device was applied to the study of the oxidation of Fe-ARMCO below 570°C. The oxidation products are identified in situ and the difference method yields curvesY(T) showing the global changes. These curves were calibrated to the microscopically measured end thickness of the oxide layer obtaining the growthx(T). A calculated curve including the Arrhenius relation was fitted to thex(T) curve yielding activation energy and values of the oxidation rate constant as a function of temperature.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' Zeitschrift für analytische Chemie 349 (1994), S. 163-165 
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Three examples for the application of time and temperature resolved X-ray diffraction for the investigation of solid state reactions and phase transitions are given. Samples were submitted to an isothermal temperature program or to stepwise heating/cooling, while diffraction patterns were measured continuously. The applications include the in situ identification of reaction products or phases, the determination of kinetic parameters, the observation of thermal expansion and the formation of layers.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Czechoslovak journal of physics 44 (1994), S. 269-276 
    ISSN: 1572-9486
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract High resolution can be obtained in the scanning electron microscope (SEM) for a very low landing energy of electrons, even for that below 50 eV, when a cathode lens is used with the specimen as a cathode held at a high negative potential but the detection of signal electrons is totally different compared with classical SEM. Primary electrons with an energy of the order of tens of keV are decelerated in the field of the cathode lens to a very low landing energy and signal electrons originating in the specimen are accelerated and collimated by the same field to a narrow beam with an electron energy nearly the same as that of the primary beam. To detect these signal electrons we must deflect them from the optical axis without deteriorating the properties of the primary beam. The design of a novel type of separator of the primary and signal electrons consisting of two stages, each of them formed by the electric and magnetic crossed fields, is presented, together with calculated trajectories for both primary and signal electrons.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' Zeitschrift für analytische Chemie 341 (1991), S. 436-438 
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Summary A fast X-ray diffraction method was applied in order to study in situ high temperature corrosion of steel surfaces. The measuring system for high temperature corrosion testing consists of an X-ray diffractometer, a high temperature device with programmable temperature controller and a Si(Li)-detector for measurements of energy dispersive diffraction spectra at temperatures from 20 to 1500°C. With a measuring time of 100 s per diffraction pattern a series of 300 measurements can be performed during one day. The atmosphere in the high temperature device can be controlled. The samples were heated in air at ambient pressure, recording X-ray diffraction spectra every 20°C. In addition, isothermal experiments were carried out at different temperatures. From the diffraction spectra the peak intensities, lattice plane distances and lattice parameters of the base material and the oxides were calculated as a function of temperature or time. The method allows an in situ identification of the corrosion products and a direct observation of phase transitions.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' Zeitschrift für analytische Chemie 346 (1993), S. 252-254 
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Summary The formation of α-Fe2O3 on Fe3O4 during the oxidation of iron below 570°C occurs very slowly and the scales are so thin that they cannot be detected by microscopy. X-ray diffraction with grazing incidence, equipped with a high temperature device, allows an ‘in situ’ study of the α-Fe2O3 formation even the initial reactions. The formation of α-Fe2O3 was studied in isothermal experiments at 400, 450, 500 and 550°C. α-Fe2O3 could already be detected at the beginning of the experiments. The difference method, a numerical treatment for kinetic evaluation, yields curves showing the growth of the α-Fe2O3 layer. Fitting the parabolic time law to these curves yields the rate constants.
    Type of Medium: Electronic Resource
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