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  • 70.72  (1)
  • Clinical trial  (1)
  • Key words Quality of life  (1)
  • 1
    ISSN: 0165-0327
    Keywords: Affective disorder ; Clinical trial ; Eligibility ; Exclusion criteria ; Patient selection ; Recruitment
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Medicine , Psychology
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1433-0407
    Keywords: Schlüsselwörter Lebensqualität ; Metaanalyse ; Depressive ; Schizophrene ; Facettenanalyse ; Modulares System ; Key words Quality of life ; Metaanalysis ; Depression ; Schizophrenia ; Facet analysis ; Modular system
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Description / Table of Contents: Summary The construct Quality of Life (QoL) is investigated by metaanalysis of eight (inter)nationally validated questionnaires in a multicenter study. Data have been collected in a mentally healthy (n=479), a depressed (n=171) and a schizophrenic (n=139) sample. Conventional psychometric criteria and a facet analytical methodology have been applied. The resulting questionnaire „Modular System for Quality of Life” (MSQoL) consists of a core module with 47 items (one „G-factor” and six subdimensions), which is sufficiently valid for all three samples. Additionally, there are four specific modules (demography, family, partnership, profession). No specific modules can be identified for the psychopathological subgroups. The validated radex structure for subjective QoL offers the opportunity for a cumulative research design and for adaptations to the actual setting.
    Notes: Zusammenfassung In einer von der Arbeitsgruppe „Lebensqualität (LQ)” der „Arbeitsgemeinschaft für Methodik und Dokumentation in der Psychiatrie” (AMDP) unterstützten multizentrischen Studie wird das Konstrukt Lebensqualität (LQ) anhand von acht (inter)national validierten Erhebungsinstrumenten sowie einer gesunden (n=479), einer depressiven (n=171) und einer schizophrenen (n=139) Stichprobe metaanalytisch untersucht. Neben herkömmlichen psychometrischen Kriterien liegt der methodische Schwerpunkt dabei auf einem facettenanalytischen Vorgehen. Der resultierende Fragebogen „Modulares System zur Lebensqualität” (MSLQ) besteht aus einem für alle 3 Stichproben hinreichend validen Kernmodul mit 47 Items (ein „G-Faktor” und 6 Subdimensionen) sowie 4 spezifischen Modulen (Demographie, Familie, Partnerschaft, Beruf). Für die psychopathologischen Subgruppen lassen sich keine spezifischen Module etablieren. Die validierte Struktur der subjektiv eingeschätzten Lebensqualität (in Form einer facettenanalytischen Radexkonstellation) bietet die Möglichkeit zu einer kumulativ angelegten Forschung und einer untersuchungsspezifischen Anpassung des MSLQ.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1432-0630
    Keywords: 70.78 ; 70.72 ; 70.73
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The infrared responsivity is measured at low temperature on Schottky barrier detectors having ultrathin (3–20 nm) PtSi, IrSi, and compound silicide films as a metal electrode on p-type silicon. The total yield for internal hole photoemission is 1% per incident photon for PtSi and 0.1% for IrSi at a wavelength of λ=4 μm. The cut-of wavelengths are λ=5.4 μm and λ=8.2 μm for PtSi and IrSi, respectively. The compound silicides fabricated by sequential evaporation of Pt and Ir and subsequent annealing at T=450° C show characteristics identical to that of PtSi. A Monte Carlo computer modelling is performed to simulate the scattering mechanisms in the thin silicide film leading to hole photoemission across the Schottky barrier into silicon. The optimum emission yield is observed for ultrathin films of the order of a few nanometers. The optimum film thickness is close to the escape depth d esc≈2–3×L el≈5 nm which scales with the mean free path L el for quasi elastic scattering. The enhancement of the internal photoemission in ultrathin silicide films is predominantly due to the increase of the optical photoexcitation density rather than to an increase of the electrical emission yield in thin films.
    Type of Medium: Electronic Resource
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