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  • 11
    Digitale Medien
    Digitale Medien
    Amsterdam : Elsevier
    Thin Solid Films 64 (1979), S. 221 
    ISSN: 0040-6090
    Quelle: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Thema: Physik
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 12
    Digitale Medien
    Digitale Medien
    Springer
    Fresenius' Zeitschrift für analytische Chemie 353 (1995), S. 389-392 
    ISSN: 1618-2650
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Chemie und Pharmazie
    Notizen: Abstract Electron probe microanalysis (EPMA) at low electron energies (typically 3–10 keV) has been used to study the composition of coatings with a film thickness of 0.1–1.3 μm (“bulk” analysis). The accuracy of quantification, including the most critical situation of low atomic number elements (boron-oxygen), is about 5% relative by use of pure element or arbitrary compound standards. A special procedure of data processing (“thin film” analysis) enables the simultaneous determination of film thickness and composition, provided that the substrate is known. The film thickness may be in the range of 2 nm to 5 μm. EPMA can be also applied in the mode of “non-destructive in-depth analysis”, which is based on the combined evaluation of experiments at different electron energies. The quantitative characterization of layered structures and implantation zones is demonstrated.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 13
    Digitale Medien
    Digitale Medien
    Springer
    Fresenius' Zeitschrift für analytische Chemie 333 (1989), S. 299-303 
    ISSN: 1618-2650
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Chemie und Pharmazie
    Notizen: Summary Amorphous carbon films with different amounts of tantalum, normally used as hard coatings with low friction coefficients (μ〈0.2), were analysed with XPS. Besides the indentification of different chemical states, a quantitative analysis was performed. In this paper we focus on the influence of surface contaminations and on the cleaning process (Ar sputtering) on quantitative XPS data. Depth profiles are presented. To verify the analytical results, the atomic concentrations are determined using own and published reference data. The quantitative XPS data were compared to EPMA measurements (a not surface-sensitive analysing technique), which reflect directly the bulk concentrations.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 14
    Digitale Medien
    Digitale Medien
    Springer
    Fresenius' Zeitschrift für analytische Chemie 353 (1995), S. 389-392 
    ISSN: 1618-2650
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Chemie und Pharmazie
    Notizen: Abstract Electron probe microanalysis (EPMA) at low electron energies (typically 3–10 keV) has been used to study the composition of coatings with a film thickness of 0.1–1.3 μm (“bulk” analysis). The accuracy of quantification, including the most critical situation of low atomic number elements (boron–oxygen), is about 5% relative by use of pure element or arbitrary compound standards. A special procedure of data processing (“thin film” analysis) enables the simultaneous determination of film thickness and composition, provided that the substrate is known. The film thickness may be in the range of 2 nm to 5 μm. EPMA can be also applied in the mode of “non-destructive in-depth analysis”, which is based on the combined evaluation of experiments at different electron energies. The quantitative characterization of layered structures and implantation zones is demonstrated.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 15
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 20-24 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: Electron probe micro-analysis is applied to the determination of thin films (20-200 nm) deposited on a known substrate. Bulk standards are used for calibration and data reduction is based on the computation of Φ(pz) depth distribution functions. The Φ(pz) model of Pouchou and Pichoir and the Gaussian Φ(pz) expression of Packwood and Brown are compared by investigating Cu and Au films on various substrates. Particular refinements, mainly by introducing an effective atomic number, are discussed in respect of double layers and a large difference between the atomic number of the film(s) and that of the substrate. Mass thickness and composition of single layers as well as double layers can be determined with an accuracy of at least 5% relative. This was estimated in comparison with chemical analysis and Rutherford backscattering spectroscopy of alloys on Si applied to magneto-optic recording.
    Zusätzliches Material: 5 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 16
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 14 (1985), S. 84-88 
    ISSN: 0049-8246
    Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: A special electron microprobe data reduction procedure permits the determination of oxygen in vacuum-deposited metal layers independent of the surface oxide layer, the mass thickness of which is simultaneously calculated. The method combines measurements of O Kα x-rays at two values of the primary electron energy in the range 5-12.5 keV, which correspond to different depth distributions of x-ray production. The measured data are evaluated by calibration curves derived from Gaussian Φ(ρz) depth distribution functions. Test analyses have been performed on amorphous metal layers with thicknesses of 0.5-1.5 μm. Typical concentrations of incorporated oxygen found ranged from 0.1 to 5 wt-%. The influences of surface oxide films with mass thicknesses of 1-30 μg cm-2 were studied by annealing experiments in agreement with the results derived from oxygen depth profiles measured by secondary ion mass spectrometry.
    Zusätzliches Material: 3 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 17
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 32-34 
    ISSN: 0049-8246
    Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: A method is described for the calibration of Ar Kα counting rates, measured using crystal spectrometers equipped with Ar-flow proportional counters. Linear extrapolation from overvoltage corrected x-ray yields of the elements with Kα x-ray energies lower than those of the ArK absorption edge gives an accurate description of the experimental Ar Kα intensity ratios from counters operated at different values of gas pressure. Results of all-element film analyses provided by a matrix correction procedure, ZAF, indicate an accuracy better than 5% relative for the determination of Ar concentrations ranging from 0.1 to 10 wt%.
    Zusätzliches Material: 2 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 18
    Digitale Medien
    Digitale Medien
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 405 (1974), S. 176-182 
    ISSN: 0044-2313
    Schlagwort(e): Chemistry ; Inorganic Chemistry
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Chemie und Pharmazie
    Beschreibung / Inhaltsverzeichnis: Lattice Vibration Spectra. IX. Pyrite Structure. FIR Spectra and Normal Coordinate Analysis of MnS2, FeS2, and NiS2The FIR absorption spectra of MnS2, FeS2, and NiS2, are recorded in the range of 600 to 30 cm-1. The absorption maxima are assigned to the five IR active optical phonons of the pyrite lattice (k = 0) predicted on the basis of the factor group. Symmetry coordinates and tentative vibration forms of the lattice vibrations are communicated. The large shifting of the absorption maxima of MnS2 (to 220 cm-1) to lower wave numbers are discussed in connection with the strength of the metal sulphur bond.
    Notizen: Die FIR-Spektren von MnS2, FeS2 und NiS2 werden im Bereich von 600 bis 30 cm-1 analysiert und den fünf IR-aktiven Translationsschwingungen des Pyritgitters zugeordnet. Die Symmetriekoordinaten der Gitterschwingungen und angenäherte Schwingungsformen konnten aus der Faktorgruppe abgeleitet werden. Die große bathochrome Verschiebung (bis 220 cm-1) der Absorptionsmaxima des MnS2 gegenüber FeS2 wird im Zusammenhang mit der Stärke der Metall-Schwefel-Bindung diskutiert.
    Zusätzliches Material: 3 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 19
    Digitale Medien
    Digitale Medien
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 428 (1977), S. 199-203 
    ISSN: 0044-2313
    Schlagwort(e): Chemistry ; Inorganic Chemistry
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Chemie und Pharmazie
    Beschreibung / Inhaltsverzeichnis: Lattice Vibration Spectra. XVI. FIR Spectra and Vibration Analysis of Dichalcogenides and Diphosphides of Iron, Ruthenium, Osmium, and PlatinumThe FIR absorption spectra of pyrite type compounds RuS2, RuS2-xSex, RuSe2, RuTe2, OsS2, OsSe2, and PtP2 as well as loellingite type phosphides FeP2, RuP2, and OsP2 are reported. For RuS2, RuSe2, RuTe2, OsS2, and PtP2 all of the five infrared allowed modes (k = 0) are observed. As a first result of a numerical normal coordinate treatment vibration forms of pyrite structure are communicated. The spectra show that lattice forces of corresponding sulfides, tellurides, and phosphides are about the same strength, but increase strongly by substitution of iron by ruthenium and especially of ruthenium by osmium. The lattice constants of the RuS2-xSex solid solution obey Vegard's rule.
    Notizen: Die FIR-Spektren der Pyrite RuS2, RuS2-xSex, RuSe2, RuTe2, OsS2, OsSe2 und PtP2 sowie der Löllingite FeP2, RuP2 und OsP2 werden im Bereich von 500-30 cm-1 analysiert. Von RuS2, RuSe2, RuTe2, OsS2 und PtP2 konnten alle fünf IR-aktiven (k = 0) Gitterschwingungen des Pyritgitters registriert werden. Die als Ergebnis einer numerischen Normalkoordinatenrechnung erhaltenen Schwingungsformen werden mitgeteilt. Die Spektren zeigen, daß die Substitution der Schwefelatome durch Selen und Tellur bzw. durch Phosphor nur wenig an den Gitterkräften ändert. Die Bindungskräfte nehmen jedoch zu, wenn Eisen durch Ruthenium bzw. Ruthenium durch Osmium ersetzt werden. Die Gitterkonstanten der RuS2-xSex-Mischkristalle entsprechen der Vegardschen Regel.
    Zusätzliches Material: 4 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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