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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 2086-2093 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Cu/Al bilayer reactions have been studied by Rutherford backscattering, Auger depth profiling, transmission electron microscopy (TEM), and internal friction. In the later stage of the solid-state reaction Al2Cu aitch-theta phase growth occurs in a planar manner at the top of the Al film and additionally along the grain boundaries of the columnar Al grains. For the early stage of the reaction where only small amounts of Cu have diffused into the Al, internal friction proved to be the only experimental technique sensitive to Cu concentrations below 500 ppm. It was found that 300 ppm of Cu are already sufficient to shift the grain boundary relaxation peak observed by internal friction to higher temperatures compared to pure Al. This behavior reflects a rise in activation energy for grain boundary diffusion from 0.55 eV for Al to about 1 eV for the AlCu system. At higher Cu concentrations the grain boundary relaxation peak remains unaffected up to a Cu concentration of 5%, decreases for higher concentrations and is completely suppressed at 19%. This behavior is closely related to microstructural changes at the grain boundaries as observed by TEM.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 893-896 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The internal friction of a 4 μm thick free-standing Al film has been investigated. For a measuring frequency of about 200 Hz a relaxation peak was found near 100 °C. Compared with a substrate-bonded film having the same columnar microstructure the peak is about three times higher while the temperature position is the same. This result confirms a model derived for substrate-bonded films which predicts that intrinsic grain boundary sliding controls the relaxation mechanism. The film/substrate-bonding only influences the peak height. It partly hinders the grain boundary sliding thereby reducing the relaxation strength. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3742-3745 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Free-standing 4-μm-thick Al thin films were prepared by partially removing the Si substrate after deposition of the film. The tensile film stress was determined from the membrane vibration frequency in the temperature range between room temperature and −190 °C. The flow stress of the free-standing films is compared to that of substrate-bonded ones deposited under identical conditions thus having basically the same microstructure. It was found that the flow stress of the unsupported films agrees with that of bulk Al (when extrapolated to the same grain size of 1–4 μm) being considerably smaller than that of substrate bonded films. This directly proves the importance of the film/substrate interface for the yield strength of substrate-bonded metallic films supporting existing theoretical models. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of organic chemistry 16 (1951), S. 854-859 
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Scandinavian journal of immunology 13 (1981), S. 0 
    ISSN: 1365-3083
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: The nucleoplasmic autoantigen RNP and Sm are of particular interest because of their association with cerium symptoms of mixed connective tissue disease and systemic lupas erythematosus. The RNP is generally thought to be a ribonucleoprotein and there is evidence that its RNA may be single-Stranded Experiments presented in this report are in support of the concept that the Sm-antigen may also be an RNA protein. Purified Sm anti-Sm precipitates were shown to have high RNA contents and treatment Of Sm-antigen with RNAse in a hypotonic medium strongly reduced its antigenicity. The latter effect indicates that the Sm-antigen may in contrast to the RNP contain double-stranded RNA, a possibility also suggested by the finding that the Sm-antigen in soluble in 2m LiCl. The Sm-antigen was found further to differ from RNP in being selectively absorbent on BD-Sephadex, while RNP remained active in the supernatant. Cytochemical studies Involving stimulation and Inhibition experiments with lectins and RNA polymerase inhibitors showed that the Sm-antigen was, in distinction to RNP, sensitive to rifampicin but not to α-amanitine. Tins suggests that the RNAs of the nucleoplasmic antigens may be synthesized by different RNA polymerases.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 72 (1950), S. 712-715 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 30 (1997), S. 653-658 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Anomalous small-angle X-ray scattering (ASAXS) of synchrotron radiation with X-ray energies near the Pt-L3 X-ray absorption edge was used to examine the size distribution of nanometer-sized catalyst particles in porous electrodes for electrocatalytic applications. Carbon-supported platinum electrocatalysts with 5–80 wt% Pt were studied in situ in an electrochemical cell with a 1 M sulfuric acid electrolyte. The anodic oxidation was found to shift the particle size distribution from a mean size of 1.7 nm in the reduced state to 2.1 nm for a 10 wt% Pt/C catalyst. From the size increase, one can infer the formation of oxide shells at the particle surfaces with layer thicknesses of about 1 nm.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 150-150 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Diffuse scattering of X-rays (Cu Kα1) has been investigated close to different Bragg reflections of Al and Cu after low-temperature electron irradiation (defect concentrations between 2 and 6 × 10−4) and results discussed.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 30 (1997), S. 1041-1047 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The decomposition kinetics of dilute Cu–Co alloys containing 0.5 at.% Co were investigated by time-resolved anomalous small-angle X-ray scattering (ASAXS). No evidence for the existence of compositional fluctuations preceding the formation of Co precipitates was found. The separated scattering curves of the Co precipitates show `self-similarity'. The results are interpreted in terms of a classical process of decomposition and values of 0.18 J m−2 for the interfacial energy and 10.9 Å for the critical radius are calculated.
    Type of Medium: Electronic Resource
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