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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1862-1867 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The defect energy levels in metalorganic chemical vapor deposition (MOCVD) grown GaxIn1−xP/InP:Fe and GaxIn1−xP/InP:S epilayers (x≤0.24) have been studied by photoluminescence (PL) and photoconductivity (PC) measurements. To understand the origin of the observed deep levels, we have determined the temperature dependence of the intensity and half-width of the dominant deep-level PL peaks. We find that (1) the dominant deep-level peaks of the samples grown on the same substrate are related to the epilayer composition, and move to higher energies with increasing gallium content; (2) the dominant deep-level peaks of the samples with the same epilayer composition grown on different substrates are different. They are attributed to the impurity in the substrate diffusing into the epilayer during MOCVD growth, forming an impurity-vacancy complex. The following tentative assignments are proposed: the dominant deep-level peaks in GaxIn1−xP/InP:Fe and GaxIn1−xP/InP:S are attributed to the emission of a (V)P-(Fe)III complex and a (V)III-(S)P complex, respectively. Comparing the deep level with the near-band-edge emission we show that (1) all deep levels are independent of the band edge as x is varied; (2) the composition dependences of the deep levels associated with such complexes depend on the site occupied by the impurity atom.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 1737-1743 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The growth of heteroepitaxial GaxIn1−xP on InP for 0〈x〈0.25 has been carried out by low-pressure metalorganic chemical vapor deposition and characterized by high-resolution x-ray diffraction and low-temperature photoluminescence measurements. The x-ray data indicate that the epilayers are under biaxial tensile strain and that, for samples with x〈0.05, the lattice mismatch is accommodated almost completely by tetragonal distortions. From photoluminescence measurements, the energy band gap is found to vary monotonically with the Ga concentration; it also shifts linearly with the elastic strain in the layer. The calculated value of 0.99×104 meV per unit strain is in good agreement with that predicted from elasticity theory.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have determined the origin of the spatial luminescence fluctuations observed between the dark line defects present in tensile strained GaxIn1−xP/InP/n+-InP heterostructures (Part I [F. Cléton et al. J. Appl. Phys. 80, 827 (1996)]). For that purpose, we have undertaken semi-quantitative and spectroscopic cathodoluminescence (CL) measurements on various specimens in areas exhibiting CL contrasts which could be as large as 80%. The analysis of the variation of the CL polychromatic signal with electron beam energy allowed us to get information on the diffusion-recombination (DR) parameters of the areas under study. From the correlation between the local relaxation level of these areas and their DR parameters, we can conclude that the variation of the misfit dislocations density at the GaxIn1−xP/InP interface is at the origin of the luminescence heterogeneities. We also demonstrate that recycling, by the GaxIn1−xP epilayer, of the photons originating from the heavily doped InP substrate, enhances the CL contrast between areas exhibiting different relaxation levels. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the optical and structural properties of tensile-strained GaxIn1−xP/InP heterojunctions by cathodoluminescence (CL) in the scanning electron microscope and by transmission electron microscopy (TEM). The lattice mismatch of the samples is ranging from 0.4% (x=5.5%) to 0.84% (x=11.8%). We show, in agreement with previous studies, that the relaxation of tensile-strained epilayers occurs by the emission of partial and perfect dislocations. The numerous twins and stacking faults which are found in the epilayers act as efficient recombination centers for electron-hole pairs and appear as dark line defects (DLDs) in CL images. "Ladderlike'' configurations of these defects are found both by TEM and CL in samples with a lattice mismatch larger than 0.5%. We also demonstrate that DLDs are contaminated by impurities. Areas with networks of perfect dislocations are found between the DLDs. The analysis of the dislocation types allows us to suggest that the growth of low-mismatched samples is two dimensional, and that it is three dimensional in highly mismatched samples. Finally, the spatial variations of the strain relaxation throughout the samples are studied by 77-K CL spectroscopic measurements and it is shown that these variations can be correlated with the various types of structural defects. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 3024-3029 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A detailed investigation of the structural and optoelectronic properties of thick GaInP epilayers on sulfur-doped InP substrates is reported. Significant variations of the optical absorption and photoluminescence transition energies from light- and heavy-hole states are observed as a function of the epilayer composition as well as of the degree of relaxation of the misfit strain. High-resolution x-ray measurements were used to determine the Ga concentrations and the strains and indicate significant anisotropic relaxation in several films. Even small relaxations result in a significant increase in the optical linewidths and a rapid drop in the transition intensities. A model with no free parameters based on the strain Hamiltonian of Pikus and Bir provides excellent agreement with the transition energies and serves to identify unambiguously the transitions observed in the optical spectra. Within this model, isotropic in-plane relaxation produces a shift of both light- and heavy-hole energies whereas anisotropic in-plane relaxation contributes only negligibly.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 273-275 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report low temperature optical absorption measurements on GaxIn1−xP/InP (x〈0.2) multiple quantum wells and strained-layer superlattices. The spectra show several well-defined peaks whose positions can be fitted within an envelope-function formalism including strain effects. We deduce conduction band offsets between the larger gap ternary and smaller gap binary materials ranging from 30 to 50 meV. Since these values are intermediate between the strain-induced shifts for the light- and heavy-hole valence bands, the electrons and heavy holes are localized in the InP layers (type I system), whereas the light holes have their quantum wells in the GaInP layers (type II system).
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Strained-layer multiple quantum well (MQW) InAsP/InP optical modulators have been fabricated from layers grown by metal-organic vapor phase epitaxy. The devices are a series of p-i(MQW)-n photodiodes in which the active core regions consist nominally of 25 periods of 10 nm InAsP quantum wells of 4.4%, 10.0%, 15.6%, and 26.4% As composition separated by 10 nm InP barriers. Structural parameters for the samples were obtained using high-resolution x-ray diffraction rocking curves and transmission electron microscopy. The series contains samples with both coherently strained and partially relaxed multi-layers where the relaxation is characterized by misfit dislocations. The band offsets for the heterostructures were determined by fitting the energy positions of the optical absorption peaks with those computed using the Marzin–Bastard model for strained-layer superlattices [as in M. Beaudoin et al., Phys. Rev. B 53, 1990 (1996)]. The conduction band discontinuities thus obtained are linear in the As composition (7.56±0.08 meV per As % in the InAsP layer) at low and room temperature for As concentrations up to 39%, and up to 17% average relaxation. Comparisons between the coherently strained and partially relaxed samples demonstrated a broadening of optical transition linewidths due to relaxation which appears to be of minor consequence for optical modulator devices as the essential optical and electrical properties remain intact. The electric field-dependent red-shift of the n=1 electron-heavy hole transition was measured by a photocurrent method and found to be enhanced in structures with lower barrier heights. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Crystal Growth 130 (1993), S. 433-443 
    ISSN: 0022-0248
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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