ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An economical, real-time differential reflection high energy electron diffraction (RHEED) measurement system which is effective in a high-noise environment is described. Two fiber optic cables sample the RHEED intensities from the phosphorescent screen in a molecular beam epitaxy (MBE) growth chamber. The first cable observes the RHEED oscillations with the inherent background noise while the second cable monitors the background noise. The differential RHEED unit subtracts the RHEED signal combined with the background noise from the background noise, leaving only the RHEED signal. The resultant "clean'' RHEED oscillation is displayed on an IBM compatible computer.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142063
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