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  • 11
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 6305-6311 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Variations in the lattice parameters of commercially available undoped and Si-doped GaAs substrates have been studied using high resolution photoluminescence (PL) spectroscopy. The lattice parameter difference between high quality epitaxial layers of GaAs and the doped substrates upon which they are grown induces a biaxial strain in the epitaxial layer which can be detected with remarkable sensitivity using low temperature PL. The PL results show that a lattice mismatch as low as 0.0013% can cause significant and well-resolved changes in the features of donor (D°X) and acceptor (A°X) bound exciton spectra, which are consistent with results obtained from samples subjected to externally applied biaxial stress. In addition to studying a variety of low lattice mismatch GaAs/GaAs:Si heterostructures, the technique is also successfully employed in the case of more highly strained GaAs grown on an In0.004Ga0.996As substrate. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2029-2031 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The growth of high-purity gallium arsenide using tertiarybutylarsine (TBA) and trimethylgallium is reported. The availability of high-purity TBA has permitted the growth of material with liquid-nitrogen mobilities of up to 80 000 cm2/V s, the highest value yet reported for growth with any alkyl arsine. The residual donor species have been identified by magnetophotoluminescence.
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 5772-5775 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Free-standing layers of high purity GaAs prepared by epitaxial liftoff are investigated using high resolution photoluminescence, optical transmission, and x-ray diffraction techniques. Low temperature (1.5 K) optical measurements of these thin, strain-free films yield spectra rich in structure, revealing much about the fundamental properties of the materials. X-ray diffraction analysis of layers as thin as 2000 Å produce well-resolved Pendellösung fringes, in excellent agreement with dynamical theory simulations. Once removed from their underlying substrates, these thin semiconductor cavities constitute unique systems for a variety of novel spectroscopic studies not possible in as-grown heterostructures. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 14
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1942-1944 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the Raman spectra of heavily carbon doped (p〉1019 cm−3) GaSb and GaAsSb. A local vibrational mode (LVM) due to carbon residing on group-V lattice sites was observed at 540 cm−1 for GaSb and 568 cm−1 for GaAs0.44Sb0.56. A gap mode at 164 cm−1 was observed for GaSb. The frequency of the LVM as well as the gap mode is in quantitative agreement with recent theoretical predictions. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 15
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1960-1962 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Temperature dependent Hall measurements were used to investigate the role of unintentional interfacial dopant layers on the electrical properties of high purity InP. Secondary ion mass spectroscopy was used to measure the level of Si contamination present in several samples at the substrate-epilayer interface. We show that the presence of interfacial dopant gives rise to two layer conduction whose temperature dependence mimics the freezeout behavior expected for a deep donor. However, the magnetic field dependence of the Hall data at low temperatures shows the expected behavior for the two layer model, including an order of magnitude variation in the apparent sheet concentration and Hall mobility over the range from 0.1 to 0.6 T at 77 K. We show that the true bulk mobility and carrier concentration can be accurately determined in samples with high interfacial contamination by performing Hall measurements at several magnetic fields at 77 K. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 976-978 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the growth and characterization of high-quality InP/GaAs0.5Sb0.5/InP heterostructures and their application to double-heterojunction bipolar transistors (DHBT). The GaAs0.5Sb0.5 layer quality was evaluated by high-resolution x-ray diffraction (XRD), low-temperature photoluminescence (PL), and atomic force microscopy (AFM). The observed 4.2 K PL linewidth was 7.7 meV and XRD rocking curves matched those of dynamical scattering simulations. In contrast to previously reported InP/GaAs0.5Sb0.5/InP DHBTs, the present devices show nearly ideal base and collector currents, low turn-on and collector offset voltages, and a high current gain. Self-aligned DHBTs exhibit a cutoff frequency over 75 GHz and common-emitter current gain greater than 100 at 300 K. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 17
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The optical properties of lattice-matched GaAsSb/InGaAs/InP heterostructures with a varying InGaAs layer thickness (0–900 Å) were investigated. These structures display strong low temperature type II luminescence, the energy of which varies with the InGaAs layer thickness and ranges from 0.453 to 0.63 eV. The type II luminescence was used to determine directly and accurately the conduction band offset of these structures. The values obtained herein are 0.36 and 0.18 eV at 4.2 K for the GaAsSb/InGaAs and GaAsSb/InP heterojunctions, respectively, with the GaAsSb conduction band higher in energy. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 18
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 3275-3277 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Dramatic enhancements of over 300× in the room temperature photoluminescence signal obtained from high purity GaAs epitaxial layers were recorded after a brief heat treatment in tertiarybutylphosphine vapor. Low temperature photoluminescence spectra indicate that, unlike other passivation techniques, the surface layer formed during this simple treatment does not induce any appreciable strain on the underlying epilayer. The increases in photoluminescence intensity are indicative of a reduction in surface recombination brought about by the formation of a very thin GaP layer that protects against surface oxidation. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 19
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 2384-2386 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have detected three- and six-fold lateral ordering in undoped and carbon-doped GaAs1−xSbx films (0.4〈x〈0.6), using plan-view and cross-sectional transmission electron microscopy. The samples were grown by organometallic vapor phase epitaxy onto oriented InP (001) substrates, at temperatures ranging from 500 to 600 °C. Spontaneous lateral superlattices with modulation parallel to the [110] in-plane direction occur with two periodicities, 6 or 3 times the random alloy 〈110〉 lattice parameter. The degree of ordering or domain size increases with growth temperature, as seen by increasing definition of the superlattice fringes in the images, and by a change from streaks to superlattice spots in the selected area diffraction patterns. While the formation mechanism is likely a surface mediated process, no differences were detected for samples in compression or tension, or between those undoped or carbon doped. The ordering correlates with large anisotropies of up to 150% in [110]/[11(underbar)0] sheet resistance ratios. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 20
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 2263-2265 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Undoped p-type GaAs epilayers were grown by low-pressure metalorganic chemical vapor deposition (MOCVD) at 650 °C and 76 Torr using either arsine or tertiarybutylarsine (TBA), and trimethylgallium (TMG). Extremely high-purity precursors were used in order to eliminate extrinsic doping effects. Carbon acceptors from the TMG were the dominant residual electrical impurities under all growth conditions. Temperature-dependent Hall measurements were used to make a quantitative comparison of the carbon acceptor concentrations for arsine- and TBA-grown epilayers over a range of As partial pressures. For a given group V partial pressure, we report a significant reduction in carbon acceptor incorporation using TBA compared with arsine under identical growth conditions.
    Type of Medium: Electronic Resource
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