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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 3205-3209 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The residual donor species in undoped GaAs epilayers grown by metalorganic chemical vapor deposition have been characterized by magnetophotoluminescence (MPL) measurements at high magnetic fields (7 T). Most samples were grown using trimethylgallium and arsine, but samples grown using the liquid group-V source t-butylarsine were also studied. The results show good agreement with identifications previously made in high-purity samples (NA+ND≤5×1014 cm−3) at zero magnetic field, but with greatly improved spectral resolution and signal levels. With the MPL technique, residual donor species were resolved even in relatively impure samples (NA+ND=1×1016) for which no information was obtained at zero magnetic field. For the samples grown with arsine, Ge donors were observed to predominate in the high-purity samples, but Si was the dominant donor in the lower-purity samples. The Si impurity was traced to contamination from a quartz baffle in the growth chamber. Lower levels of sulfur donors were observed in many samples. Sulfur was found to be the second most predominant donor after Ge in samples grown with t-butylarsine.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 2797-2801 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Residual donor and acceptor species were studied in a series of high purity n-type InP epilayers grown by metalorganic chemical vapor deposition using tertiarybutylphosphine and trimethylindium (TMIn). Over the entire range of growth conditions, the residual donors were found to be S and Si using magnetophotoluminescence spectroscopy. These designations agreed with the observed dependence of the transport data on growth conditions. Residual levels of Zn and Mg or Be acceptors were identified by photoluminescence (PL) measurements at low excitation powers. C acceptors were below the limits of detection by PL, as in other studies using phosphine and TMIn.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2029-2031 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The growth of high-purity gallium arsenide using tertiarybutylarsine (TBA) and trimethylgallium is reported. The availability of high-purity TBA has permitted the growth of material with liquid-nitrogen mobilities of up to 80 000 cm2/V s, the highest value yet reported for growth with any alkyl arsine. The residual donor species have been identified by magnetophotoluminescence.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The optical properties of lattice-matched GaAsSb/InGaAs/InP heterostructures with a varying InGaAs layer thickness (0–900 Å) were investigated. These structures display strong low temperature type II luminescence, the energy of which varies with the InGaAs layer thickness and ranges from 0.453 to 0.63 eV. The type II luminescence was used to determine directly and accurately the conduction band offset of these structures. The values obtained herein are 0.36 and 0.18 eV at 4.2 K for the GaAsSb/InGaAs and GaAsSb/InP heterojunctions, respectively, with the GaAsSb conduction band higher in energy. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 2952-2956 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Very high purity n-type GaAs epilayers were grown by low pressure metalorganic chemical vapor deposition using triethylgallium and tertiarybutylarsine (TBA) or arsine (AsH3). Peak Hall mobilities of 209 000 cm2/V s at 45 K were observed for growth with TBA. Carrier concentration and mobility measurements down to liquid helium temperatures verified the high purity of these layers. Scattering mechanisms were determined by fits to the mobility data, and found to be in agreement with previous high purity GaAs studies. Donor identification was carried out using magnetophotoluminescence spectroscopy. A comparison of the residual donor species for AsH3- and TBA-grown epilayers is presented. No evidence of preferential n-dopant incorporation was observed for layers grown with TBA.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 6305-6311 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Variations in the lattice parameters of commercially available undoped and Si-doped GaAs substrates have been studied using high resolution photoluminescence (PL) spectroscopy. The lattice parameter difference between high quality epitaxial layers of GaAs and the doped substrates upon which they are grown induces a biaxial strain in the epitaxial layer which can be detected with remarkable sensitivity using low temperature PL. The PL results show that a lattice mismatch as low as 0.0013% can cause significant and well-resolved changes in the features of donor (D°X) and acceptor (A°X) bound exciton spectra, which are consistent with results obtained from samples subjected to externally applied biaxial stress. In addition to studying a variety of low lattice mismatch GaAs/GaAs:Si heterostructures, the technique is also successfully employed in the case of more highly strained GaAs grown on an In0.004Ga0.996As substrate. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 2460-2465 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The growth of high-purity InP on various As-, S-, and Fe-doped InP substrates has been investigated using high-resolution photoluminescence spectroscopy (PL) and high-resolution x-ray diffractometry. Substrate induced strains of −7×10−5 or less have been observed using low-temperature PL. In this way information about the strain dependence of the electronic excited states of the donor bound excitons in InP was obtained. In addition, it was shown that the assessment of variations in substrate lattice parameter can be determined with a resolution of at least 5×10−6 by PL techniques.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 1625-1630 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetophotoluminescence spectroscopy (MPL) has been used to ascertain the source of donor impurities in high-purity GaAs grown by atmospheric pressure metalorganic vapor deposition using arsine and trimethylgallium. A linear correlation between absolute MPL intensity and net carrier concentration for high-purity n-type epilayers over the concentration range 1×1014–2×1015 cm−3 provided an unambiguous method for identifying the source of donor impurities by comparing epilayers grown with different source batches. Batch-to-batch variations in the quality of films grown with eight different arsine cylinders were traced directly to the presence of varying amounts of a Ge-containing contaminant in the arsine.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 2384-2386 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have detected three- and six-fold lateral ordering in undoped and carbon-doped GaAs1−xSbx films (0.4〈x〈0.6), using plan-view and cross-sectional transmission electron microscopy. The samples were grown by organometallic vapor phase epitaxy onto oriented InP (001) substrates, at temperatures ranging from 500 to 600 °C. Spontaneous lateral superlattices with modulation parallel to the [110] in-plane direction occur with two periodicities, 6 or 3 times the random alloy 〈110〉 lattice parameter. The degree of ordering or domain size increases with growth temperature, as seen by increasing definition of the superlattice fringes in the images, and by a change from streaks to superlattice spots in the selected area diffraction patterns. While the formation mechanism is likely a surface mediated process, no differences were detected for samples in compression or tension, or between those undoped or carbon doped. The ordering correlates with large anisotropies of up to 150% in [110]/[11(underbar)0] sheet resistance ratios. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 976-978 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the growth and characterization of high-quality InP/GaAs0.5Sb0.5/InP heterostructures and their application to double-heterojunction bipolar transistors (DHBT). The GaAs0.5Sb0.5 layer quality was evaluated by high-resolution x-ray diffraction (XRD), low-temperature photoluminescence (PL), and atomic force microscopy (AFM). The observed 4.2 K PL linewidth was 7.7 meV and XRD rocking curves matched those of dynamical scattering simulations. In contrast to previously reported InP/GaAs0.5Sb0.5/InP DHBTs, the present devices show nearly ideal base and collector currents, low turn-on and collector offset voltages, and a high current gain. Self-aligned DHBTs exhibit a cutoff frequency over 75 GHz and common-emitter current gain greater than 100 at 300 K. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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