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  • 1
    ISSN: 0370-2693
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of medicinal chemistry 15 (1972), S. 1165-1168 
    ISSN: 1520-4804
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5064-5076 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Extraction energies for diamond and zinc-blende semiconductor compounds and pseudobinary alloys are calculated using a tight-binding cluster method, where the final state of the removed atom is in a free-atom state. The extraction energies provide a convenient reference from which other final states of the removed atoms can be calculated. In the elemental and compound semiconductors, the convergence of the cluster calculation was verified using a Green's function calculation with the same Hamiltonian. For the elemental semiconductors, vacancy (or Schottky defect) formation energies, in which the final state of the removed atom is on the surface, have been calculated. For pseudobinary alloys of the form A1−xBxC, we find extraction energies to be very sensitive to the local environment, exhibiting a nonlinear variation between the A- and B-rich local environments; the nonlinearity is especially pronounced for the removal of a C atom. Nonlinearities are found to arise primarily from the occupation of localized vacancy states. The impact that these alloy variations will have on measurable properties are discussed.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4176-4180 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ion species and their ratios in nitrogen, oxygen, and argon plasmas in the plasma source ion implantation process have been determined with a simple and low-cost measurement system. The measured ion species ratio in the nitrogen plasma was used as an input parameter for the computer simulation code transport and mixing from ion irradiation to predict the atomic composition-depth profile. Comparison between the code results and data derived from Auger analysis for a nitrogen-implanted Ti-6Al-4V alloy showed good agreement. In this article, the design, performance, and possible future improvements regarding the resolution of this measurement system will be discussed.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 6757-6760 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nitrogen ion implantation of Ti-6Al-4V knee joint femoral components was carried out by both plasma source ion implantation (PSII), a non-line of sight technique, and conventional beamline implantation. Implantation using the PSII process was performed on a flat sample as well as a 2×2 square array of components to demonstrate batch processing capability. The retained dose of the flat sample and at different locations on the implanted components was measured by a scanning auger microprobe (SAM). The variation in dose of the PSII treated component was found to be within the SAM error, while the dose at one location on the beamline implanted component was found to be significantly low. For the beamline case, the SAM results show good agreement with the PC profile computer simulation, which includes the angular dependence of sputtering.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 4020-4028 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Green's function method is used to calculate the removal energies of constituent atoms from various unreconstructed semiconductor surfaces. An efficient difference equation approach within the second-neighbor tight-binding model is used. For a compound AB, binding energies for the A and B atoms on the (111), (1¯1¯1¯), (100), and (110) surfaces are calculated. Energy to remove an atom from the nearly full surface, Ec (where the removed atom leaves behind a surface vacancy), and from the nearly empty surface, Ed (where the removed atom was isolated on the surface), is obtained. Results are presented for Si, GaAs, CdTe, and HgTe. The surface sublimation energies are shown to depend on surface coverage and do not exhibit a simple linear relationship to the number of bonds broken, as is often assumed in modeling growth by molecular-beam epitaxy (MBE). Although the anion and cation extraction energies depend on surface coverage and orientation, when averaged over a double layer, they always sum to the bulk cohesive energy. Moreover, Ec−Ed can be positive, implying effective attractive in-plane surface interactions, or negative, implying effective repulsive interactions. Ec−Ed tends to be positive for covalent and narrow-gap semiconductors, and negative for wide-gap and more ionic semiconductors. Surface sublimation energies are important input parameters for the modeling of MBE growth; their importance is demonstrated using a simple thermodynamic growth model and results are shown to explain anomalies found in MBE growth of HgCdTe.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Science Inc
    Journal of metamorphic geology 20 (2002), S. 0 
    ISSN: 1525-1314
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: Three periods of mineral growth and three generations of spiral-shaped inclusion trails have been distinguished within folded rocks of the Qinling-Dabie Orogen, China, using the development of three successive and differently trending sets of foliation intersection axes preserved in porphyroblasts (FIAs). This progression is revealed by the consistent relative sequence of changes in FIA trends from the core to rim of garnet porphyroblasts in samples with multiple FIAs. The first and second formed sets of FIAs trend oblique to the axial planes of macroscopic folds that dominate the outcrop pattern in this region. The porphyroblasts containing these FIAs grew prior to the development of the macroscopic folds, yet the FIAs do not change orientation across the fold hinges. The youngest formed FIAs (set 3) lie subparallel to the axial planes of these folds and the porphyroblasts containing these FIAs formed in part as the folds developed. The deformation associated with all three generations of spiral-shaped inclusion trails in garnet porphyroblasts involved the formation of subhorizontal and subvertical foliations against porphyroblast rims accompanied by periods of garnet growth; pervasive structures have not necessarily formed in the matrix away from the porphyroblasts. The macroscopic folds are heterogeneously strained from limb to limb, doubly plunging and have moderately dipping axial planes. The consistent orientation of Set 1 FIAs indicates that the development of spiral-shaped inclusion trails in porphyroblasts with FIAs belonging to Set 2 did not involve rotation of the previously formed porphyroblasts. The consistent orientation of Sets 1 and 2 FIAs indicate that the development of spiral-shaped inclusion trails in porphyroblasts with FIAs belonging to Set 3 did not involve rotation of the previously formed porphyroblasts during folding. This requires a fold mechanism of progressive bulk inhomogeneous shortening and demonstrates that spiral-shaped inclusion trails can form outside of shear zones.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 7124-7129 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Utilizing the strain-induced lateral-layer ordering (SILO) process, we have grown GaxIn1−xP multiple quantum wires (MQWR) on ternary GaAs0.66P0.34 substrates using a modified strain-balance mechanism. The resulting [110] lateral modulation occurred with a periodicity of ∼300 A(ring). Two dimensions of quantum confinement were obtained by surrounding the laterally confined GaxIn1−xP regions by layers of higher-energy-gap Al0.15Ga0.53In0.32P in the growth direction. A redshift in the photoluminescence emission was observed as the growth temperature was increased attributed to a stronger lateral composition modulation at the higher growth temperatures. Based on the modified strain-balance mechanism, light-emitting diodes with the GaxIn1−xP MQWR active region were fabricated using the SILO process. Strongly TE-polarized room-temperature electroluminescence from these devices was observed at 6470 A(ring). © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 1233-1235 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interdiffusion of lateral composition modulated (GaP)2/(InP) 2 short-period superlattices (SPSs) is reported. The lateral composition modulation is achieved by the strain induced lateral layer ordering (SILO) process. A blueshift in the interband transition is observed by photoluminescence spectroscopy for capless and SiO 2 encapsulated annealed SPSs (800 °C, 5.5 h), while the intensity and wavelength of Si3N4 encapsulated annealed SPSs are only slightly perturbed. From transmission electron microscopy, capless annealed SPSs (800 °C, 5.5 h) retain their lateral composition modulation, however, the (001/2) satellite reflections disappear. For long anneal times (48 h), the interband transition corresponds to that of a In0.50Ga 0.50P alloy, suggesting the lateral composition modulation disappears. The observed lateral interdiffusion coefficient exceeds the vertical by a factor of ∼30, suggesting SPS interdiffusion is enhanced by native point defects. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 4045-4048 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Near band edge absorption spectra of the narrow-gap semiconductor alloys InxTl1−xP, InxTl1−xAs, and InxTl1−xSb were calculated and compared with those of HgxCd1−xTe. To test accuracy, we compared the calculated absorption spectra in GaAs with experimental results and found good agreement. Within 50 meV from the absorption edge, the absorption coeffi cient of InxTl1−xP is found to have about the same magnitude as that in HgxCd1−xTe and GaAs, whereas that in InxTl1−xAs and InxTl1−xSb is much smaller. This result and other merits found from previous studies indicate that InxTl1−xP has a potential to compete favorably with HgxCd1−xTe for long-wavelength infrared applications. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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