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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 3485-3491 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Single-crystal Cu has been ion implanted with C to fluences of 1×1018/cm2 followed by laser annealing with nanosecond pulses from an excimer laser and subsequently etched in dilute nitric acid. Raman spectroscopy, Rutherford backscattering, and electron microscopy have been used to identify the distribution and morphology of the carbon at different stages of sample processing. Polycrystalline graphite and amorphous carbon films are typically produced over a wide range of processing conditions; well-ordered graphite can be formed as well. Small Cu crystallites are seen in areas where the etch lifted the C films off the substrate. However, extensive analysis by Raman spectroscopy and electron microscopy provides no evidence for the formation of the diamond phase of carbon.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 7818-7822 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pulsed KrF (248 nm) laser ablation of a polycrystalline ZnS target has been used to grow very smooth and carbon-free, epitaxial ZnS thin films on GaAs (001) and (111). Films were grown at temperatures of 150–450 °C, using a rotating substrate heater and deposition geometry that produces highly uniform film thickness, without nucleation or surface-roughening problems. X-ray diffraction and high-resolution transmission electron microscopy (HRTEM) show that the ZnS films are fully epitaxial (in-plane aligned). Films grown at the optimum temperature of 325 °C have x-ray rocking curve widths that are indistinguishable from molecular-beam-epitaxy-grown ZnS/GaAs films of the same thickness. Rutherford backscattering spectrometry and HRTEM show that in films ∼275 nm thick, the ∼150 nm nearest the GaAs-ZnS interface is highly faulted, due to the ∼4.1% lattice mismatch and/or the low ZnS stacking fault energy, but the upper ∼125 nm is much less defective. The anisotropy of the ZnS epitaxial growth rate between the GaAs (001) and GaAs (111) surfaces was found to be slightly temperature dependent.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In situ growth of highly oriented YBa2Cu3O7−x thin films (200–500 nm in thickness) has been obtained by pulsed KrF (248 nm) laser ablation on both rigid and flexible randomly oriented polycrystalline yttria-stabilized zirconia substrates. It is shown that c-axis-perpendicular YBa2Cu3O7−x films with a mosaic spread of only 1.0° can be grown on these randomly oriented polycrystalline substrates. Superconducting thin films were obtained with Tc(R=0)∼89 K on well-polished substrates. For the films deposited on the flexible substrates, the superconducting Tc is not degraded by repeated bending of the flexible substrate/film composite over a 2.25-cm-radius arc although the normal-state resistivity increases slightly, suggesting the creation of microcracks. The YBa2Cu3O7−x films grown on rigid polycrystalline yttria-stabilized zirconia substrates have a critical current density Jc(H=0)∼1400 A/cm2 at 77 K.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 2545-2547 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Highly N-doped (mid-1019 to (approximately-greater-than)1020 cm−3) ZnTe/(001)GaAs epitaxial films have been grown by pulsed laser ablation (PLA) of a stoichiometric ZnTe target in a high-purity N2 ambient (50 to 200 mTorr) without the use of any assisting dc or ac plasma source. Unlike recent experiments in which atomic N, extracted from dc and rf plasma sources, was used to produce N-doping during molecular beam epitaxy, spectroscopic measurements performed during PLA of ZnTe in N2 do not reveal the presence of atomic N. This suggests that the high hole concentrations in laser ablated ZnTe are produced by a new mechanism, possibly energetic beam-induced reactions with excited N2 adsorbed on the film surface, and/or transient formation of Zn–N complexes in the energetic ablation plume. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 3008-3010 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a new method to grow epitaxial semiconductor alloys with continuously variable composition, while using a single pulsed laser ablation target of fixed composition. Epitaxial ZnSe1−xSx films with continuously variable sulfur content, x, were grown by ablating a ZnSe target through low-pressure ambient H2S gas. The sulfur content was easily controlled in the range 0〈x〈0.18 by varying the H2S partial pressure from 0 to 45 mTorr, for films grown at 325 °C. ZnSe1−xSx films differing in composition by as much as x=0.52 from the pure ZnSe target have been grown at 400 °C. We have used this method to grow heteroepitaxial structures with continuously graded or periodically repeating, abrupt compositional changes (compositional superlattices). This development removes the principal barrier to pulsed-laser ablation (PLA) growth of compositionally graded semiconductor thin-film materials, namely that the film and target normally have the same composition. The method appears to have broad application for PLA growth of other compound semiconductor films and heterostuctures, as well as to dope individual layers.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 512-514 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of ZnS grown on GaAs by laser ablation are examined using spectroscopic two-channel polarization modulation ellipsometry (2-C PME). It is found that variations in the film thickness over the illumination spot result in the quasidepolarization of the incident light, which can be measured directly using 2-C PME. Quantitative fits of the ellipsometry data using a distribution-of-thicknesses model agree with independent reflectivity measurements of the thickness gradient, and allow for the accurate determination of the optical functions of the ZnS film.
    Type of Medium: Electronic Resource
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