ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
A rigorous strategy for (X-ray) diffraction stress measurements at fixedpenetration/information depths is described. Thereby errors caused by lack of penetration-depthcontrol in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges ofaccessible penetration/information depths and experimental aspects are briefly discussed. The powerof the method is illustrated by the analysis of an only small stress gradient in a sputter-depositednickel layer
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/13/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.13.pdf
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